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Specific Process Knowledge/Thermal Process/C1 Furnace Anneal-oxide: Difference between revisions

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*Oxidation of 100 mm and 150 mm wafers
*Oxidation of 100 mm and 150 mm wafers
*Annealing of 100 mm and 150 mm wafers
*Annealing of 100 mm and 150 mm wafers
|style="background:WhiteSmoke; color:black"|Oxidation:
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*Dry
Annealing:
*Wet: with RASIRC steamer
*Using N<sub>2</sub>:
Oxidation:
*Dry oxidation using O<sub>2</sub>:
*Wet oxidation using H<sub>2</sub>: O vapour generated by a RASIRC steamer
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!style="background:silver; color:black" align="center"|Performance
!style="background:silver; color:black" align="center"|Performance
|style="background:LightGrey; color:black"|Film thickness
|style="background:LightGrey; color:black"|Film thickness
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*Dry SiO<sub>2</sub>: 50Å to ~2000Å (it takes too long to grow a thicker oxide)
*Dry SiO<sub>2</sub>: ~ 0 nm to 300 nm (it takes too long to grow a thicker dry oxide layers)
*Wet SiO<sub>2</sub>: 50Å to ~5µm (it takes too long to grow a thicker oxide)
*Wet SiO<sub>2</sub>: ~ 0 nm to ~ 3 µm (23 hours wet oxidation at 1100 <sup>o</sup>C)
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Process parameter range
|style="background:LightGrey; color:black"|Process Temperature
|style="background:LightGrey; color:black"|Process Temperature
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*800-1150 <sup>o</sup>C
*800-1100 <sup>o</sup>C
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|style="background:LightGrey; color:black"|Process pressure
|style="background:LightGrey; color:black"|Process pressure
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*1 atm
*1 atm (no vacuum)
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|style="background:LightGrey; color:black"|Gas flows
|style="background:LightGrey; color:black"|Gas flows
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|style="background:LightGrey; color:black"|Batch size
|style="background:LightGrey; color:black"|Batch size
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*1-30 100 mm or 150 mm wafers (or 50 mm wafers) per run
*1-30 100 mm or 150 mm wafers (or 50 mm wafers)
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| style="background:LightGrey; color:black"|Substrate materials allowed
| style="background:LightGrey; color:black"|Substrate materials allowed
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*New silicon wafers (No need RCA cleaned)
*New silicon wafers  
*Silicon wafers with layers of silicon oxide or silicon (oxy)nitride (RCA cleaned)
*Silicon wafers with layers of silicon oxide or silicon nitride (RCA cleaned)
*Wafers from the LPCVD furnaces  
*Wafers from the LPCVD furnaces  
*Wafers from PECVD4
*Wafers from PECVD4
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