Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions
Appearance
| Line 145: | Line 145: | ||
'''The user manual, quality control procedure and results, technical information and contact information can be found in LabManager:''' | '''The user manual, quality control procedure and results, technical information and contact information can be found in LabManager:''' | ||
[http://labmanager. | [http://labmanager.nanolab.dtu.dk/function.php?module=Machine&view=view&mach=169 FilmTek in LabManager] | ||
<br clear="all" /> | <br clear="all" /> | ||
| Line 269: | Line 269: | ||
|} | |} | ||
--> | --> | ||
==F10-RT reflectometer, transmitance, film thickness measurements [[Image:section under construction.jpg|70px]]== | ==F10-RT reflectometer, transmitance, film thickness measurements [[Image:section under construction.jpg|70px]]== | ||