LabAdviser/314/Microscopy 314-307/TEM/ATEM: Difference between revisions
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= Titan ATEM = | = FEI Titan 80-300 ATEM = | ||
[[image:8212.JPG|400x267px|right|thumb|Titan ATEM in building 314.]]Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. EDS and EELS equipped to the microscope can be used for elemental analysis from regions that are as small as 1 nm. Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios). This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens. <br /> | [[image:8212.JPG|400x267px|right|thumb|Titan ATEM in building 314.]] | ||
Titan Analytical can be used in two conditions, transmission (TEM) and scanning transmission (STEM) modes. The point (interpretable) resolutions for TEM and STEM at 300 kV are 0.2 and 0.08 nm, respectively, which allows atomic arrangements in materials to be visualized clearly. EDS and EELS equipped to the microscope can be used for elemental analysis from regions that are as small as 1 nm. Specially, monochromated EELS, which is reachable to an energy resolution of 0.15 eV, allows the distribution of surface plasmons in nanostructured materials to be imaged at the nanometer scale and makes possible to determine the valence state of elements (e.g., Fe2+/Fe3+ ratios). This microscope is also dedicated to magnetic and electrostatic potential imaging since it has a biprism located at a selected-area aperture position and a Lorentz lens. This capability not only offers us to characterize magnetic materials and semiconductor devices but also may make possible to visualize different chemical states in low-density materials such as polymers and biological specimens. <br /> | |||
= Sample holders = | = Sample holders = | ||
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David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009). | David B. Williams, C. Barry Carter, Transmission Electron Microscopy - A Textbook for Materials Science (Springer, 2009). | ||
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