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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Line 27: Line 27:
!style="background:silver; color:black" align="left"|Modes included
!style="background:silver; color:black" align="left"|Modes included
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*ScanAsyst
*PeakForce Tapping mode / ScanAsyst
*TappingMode (air)
*TappingMode (air)
*Contact Mode
*Contact Mode
Line 50: Line 50:


|style="background:WhiteSmoke; color:black" valign="top"|
|style="background:WhiteSmoke; color:black" valign="top"|
*ScanAsyst
*PeakForce Tapping mode / ScanAsyst
*TappingMode (air)
*TappingMode (air)
*Contact Mode
*Contact Mode
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