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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

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===Extra chuck===
'''We have two chucks:'''
*A symmetric chuck that handles up to 210mm wafers and 15mm thick
*An asymmetric chuck that handles up to ~4" wafer (but not small pieces) - using this a whole 4" can be accessed without rotating the sample.
===Holders===
*Magnetic sample holder + magnetic discs + double sided tape
*Holder for vertical profile scans
===Modes included===
*ScanAsyst
*TappingMode (air)
*Contact Mode
*Lateral Force Microscopy
*PhaseImaging
*Lift mode
*MFM
*Force Spectroscopy
*Force volume
*EFM
*surface potential
*Torsional Resonance Mode
*Piezoresponse Microscopy
*Force spectroscopy
'''Extra modes:'''
*PeakForce KPFM package (incl extra box for high voltage PF KPFM)
*PFQNM package
*Microscope Image Registration and Overlay (MIRO) software. '''this is only working in the old software (before version 9.4)'''
===Probes===
Probes that followed the system (we may not have them anymore!)
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;"
|-
|-
|-style="background:silver; color:black"
!
!ScanAsyst mode
!Tapping mode
!Contact mode
!PF-KPFM
|-
|-
|-style="background:WhiteSmoke; color:black"
!Generel description
|Generel description
|Generel description
|
|
|-
|-
|-style="background:LightGrey; color:black"
!Probes that followed the system
|
*ScanAsyst air 30ps
*ScanAsyst fluid 10ps
*ScanAsyst fluid + 10ps
|
*MPP-11100-10
*MPP-21100-10
*MPP-11120-10 RTESPA
*TESPA-V2 10ps
*OTESPA-R3 10ps
*High Aspect ratio probes 1:15: FIB6-400A 5ps
*MPP-12120 10ps.  Tap150A
*MPP-13120-10 TAP525A
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*SNL-10 20ps
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*SCM-PIT 10ps
*PFQNE-Al 10ps
|-
|}
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===Samples===
*QC grid: VGRP-15M 10µm pitch and depth reference 178nm
*PF KPFM-SMPL Kelvin probe Sample: Al + Au on Si
'''Calibration samples for getting quantitative modulus measurements:'''
#PDMS-soft-1-12M: PDMS gel 2.5MPa
#PDMS-soft-2-12M: PDMS gel 3.5MPa
#PSFilm-12M: Polystyrene filem
#FSilica-12M: Fused Silica
#Sapphire-12M: Sapphire
#RS-12M: Ti roughness sample
#HOPG-12M: Highly Orientated Pyrolytic Graphite
#PS-LDPE: Harmonix training
*HOPG: Highly Oriented Pyrolytic Graphite


==AFM Icon-Pt 1: Acceptance tests done==
==AFM Icon-Pt 1: Acceptance tests done==