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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

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|style="background:silver; color:black"|Samples
|style="background:WhiteSmoke; color:black"|<30pm RMS
|style="background:WhiteSmoke; color:black"|<30pm RMS
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|style="background:silver; color:black"|
|style="background:WhiteSmoke; color:black"|<0.15nm RMS
|style="background:WhiteSmoke; color:black"|<0.15nm RMS
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|style="background:silver; color:black"|
|style="background:WhiteSmoke; color:black"|35pm RMS
|style="background:WhiteSmoke; color:black"|35pm RMS
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|style="background:silver; color:black"|
|style="background:WhiteSmoke; color:black"|<0.5%
|style="background:WhiteSmoke; color:black"|<0.5%
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|style="background:silver; color:black"|
|style="background:WhiteSmoke; color:black"|<0.15nm RMS
|style="background:WhiteSmoke; color:black"|<0.15nm RMS
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|style="background:WhiteSmoke; color:black"|~1 for our standard probe. Can be improved to about 10 with the right probe
|style="background:WhiteSmoke; color:black"|~1 for our standard probe. Can be improved to about 10 with the right probe
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!style="background:silver; color:black" align="left"|Hardware settings
|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm
|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm
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|style="background:WhiteSmoke; color:black"|[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in Air]
|style="background:WhiteSmoke; color:black"|[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in Air]
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|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G.html Tap300Al-G]
|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G.html Tap300Al-G]
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|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-SSS-NCHR.html SSS-NCHR]
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|style="background:silver; color:black"|
|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-AR5-NCHR.html AR5-NCHR]
|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/AFM-Probe-AR5-NCHR.html AR5-NCHR]
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*[http://www.brukerafmprobes.com Bruker]
*QC grid: VGRP-15M 10µm pitch and depth reference 178nm
*[http://www.nanoandmore.com/home.php www.nanoandmore.com]
*PF KPFM-SMPL Kelvin probe Sample: Al + Au on Si
 
'''Calibration samples for getting quantitative modulus measurements:'''
 
#PDMS-soft-1-12M: PDMS gel 2.5MPa
#PDMS-soft-2-12M: PDMS gel 3.5MPa
#PSFilm-12M: Polystyrene filem
#FSilica-12M: Fused Silica
#Sapphire-12M: Sapphire
#RS-12M: Ti roughness sample
#HOPG-12M: Highly Orientated Pyrolytic Graphite
#PS-LDPE: Harmonix training
 
 
*HOPG: Highly Oriented Pyrolytic Graphite
 
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
*[http://www.brukerafmprobes.com Bruker]
*QC grid: VGRP-15M 10µm pitch and depth reference 178nm
*[http://www.nanoandmore.com/home.php www.nanoandmore.com]
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!style="background:silver; color:black" align="left"|Substrates
|style="background:WhiteSmoke; color:black"|Up to 210mm in diameter and up to 15mm thick"
|style="background:WhiteSmoke; color:black"|Up to 210mm in diameter and up to 15mm thick"
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*180mmx150mm inspection area
*2µm repeatability, unidirectional
*3µm repeatability, bidirectional
|style="background:WhiteSmoke; color:black"|
*180mmx150mm inspection area
*2µm repeatability, unidirectional
*3µm repeatability, bidirectional
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|style="background:WhiteSmoke; color:black"|In principle all materials
|style="background:WhiteSmoke; color:black"|In principle all materials
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