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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/AFM Icon Acceptance: Difference between revisions

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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,319 edits
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|-
!style="background:silver; color:black" align="left"|Performance
!style="background:silver; color:black" align="left"|Modes included
|style="background:WhiteSmoke; color:black"|Up to 90 µm square
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|Up to 90 µm square
*ScanAsyst
*TappingMode (air)
*Contact Mode
*Lateral Force Microscopy
*PhaseImaging
*Lift mode
*MFM
*Force Spectroscopy
*Force volume
*EFM
*surface potential
*Torsional Resonance Mode
*Piezoresponse Microscopy
*Force spectroscopy
 
 
'''Extra modes:'''
 
*PeakForce KPFM package (incl extra box for high voltage PF KPFM)
*PFQNM package
*Microscope Image Registration and Overlay (MIRO) software. '''this is only working in the old software (before version 9.4)'''
 
|style="background:WhiteSmoke; color:black"|
*ScanAsyst
*TappingMode (air)
*Contact Mode
*Lateral Force Microscopy
*PhaseImaging
*Lift mode
*MFM
*Force Spectroscopy
*Force volume
*EFM
*surface potential
*Torsional Resonance Mode
*Piezoresponse Microscopy
*Force spectroscopy
 
 
|-
|-
|style="background:silver; color:black"|
|style="background:silver; color:black"|
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