LabAdviser/314/Microscopy 314-307/SEM/Nova/Transmission Kikuchi diffraction: Difference between revisions
| Line 54: | Line 54: | ||
= In-situ heating TKD analysis of ultra-thin metal films = | = In-situ heating TKD analysis of ultra-thin metal films = | ||
== Solid-state dewetting == | |||
In this section, the in-situ and high temperatures capabilities of TKD for the analysis of metal thin-films are presented. The model example chosen for this analysis is the solid-state dewetting of Au thin-films. Solid-state dewetting is a morphological evolution by which an initially continuous thin film on an inert substrate turns into a discontinuous array of isolated islands, as sketched in Fig. 7. | In this section, the in-situ and high temperatures capabilities of TKD for the analysis of metal thin-films are presented. The model example chosen for this analysis is the solid-state dewetting of Au thin-films. Solid-state dewetting is a morphological evolution by which an initially continuous thin film on an inert substrate turns into a discontinuous array of isolated islands, as sketched in Fig. 7. | ||