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LabAdviser/314/Microscopy 314-307/SEM/Nova/Transmission Kikuchi diffraction: Difference between revisions

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= Indexing of Kikuchi patterns =
= Indexing of Kikuchi patterns =


The automated determination of the position of Kikuchi lines in a diffraction pattern (and consequently of lattice planes in the crystal) has enabled the practical use of Kikuchi diffraction for the study of micro- and nanomaterials. An algorithm known as the Hough transform was introduced by Krieger Lassen to recognize the edges of the Kikuchi bands [1,2]. The Hough transform is a mathematical tool which can be used to isolate features of a particular shape, such as lines, circles and ellipses, within an image. The main advantage of the Hough transform is that it is relatively unaffected by image noise. The essential idea of the the Hough transform consists of applying to each pixel of the Kikuchi pattern the equation:
The automated determination of the position of Kikuchi lines in a diffraction pattern (and consequently of lattice planes in the crystal) has enabled the practical use of Kikuchi diffraction for the study of micro- and nanomaterials. An algorithm known as the Hough transform was introduced to recognize the edges of the Kikuchi bands. The Hough transform is a mathematical tool which can be used to isolate features of a particular shape, such as lines, circles and ellipses, within an image. The main advantage of the Hough transform is that it is relatively unaffected by image noise. The essential idea of the the Hough transform consists of applying to each pixel of the Kikuchi pattern the equation:


''ρ''i = xcos''θ''i + ysin''θ''i (1)
''ρ''i = xcos''θ''i + ysin''θ''i (1)