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Specific Process Knowledge/Etch/Wet Silicon Nitride Etch: Difference between revisions

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!
!
! Nitride Etch @ 180 <sup>o</sup>C
! Nitride Etch @ 160 <sup>o</sup>C
! Nitride Etch @ 160 <sup>o</sup>C
|-
|-
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|-style="background:WhiteSmoke; color:black"
!Generel description
!Generel description
|Etch/strip of silicon nitride
|Etch/strip of silicon nitride
|Etch/strip of silicon nitride
|-
|-
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|-style="background:LightGrey; color:black"
!Link to safety APV and KBA
!Link to safety APV and KBA
|[http://labmanager.danchip.dtu.dk/d4Show.php?id=1892&mach=130 see APV here]
[http://kemibrug.dk/KBA/CAS/116297/?show_KBA=1&portaldesign=1 see KBA here]
|[http://labmanager.danchip.dtu.dk/d4Show.php?id=1892&mach=130 see APV here]  
|[http://labmanager.danchip.dtu.dk/d4Show.php?id=1892&mach=130 see APV here]  
[http://kemibrug.dk/KBA/CAS/116297/?show_KBA=1&portaldesign=1 see KBA here]  
[http://kemibrug.dk/KBA/CAS/116297/?show_KBA=1&portaldesign=1 see KBA here]  
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|-style="background:WhiteSmoke; color:black"
!Chemical solution
!Chemical solution
|H<sub>3</sub>PO<sub>4</sub>    (85 wt%)
|H<sub>3</sub>PO<sub>4</sub>    (85 wt%)
|H<sub>3</sub>PO<sub>4</sub>    (85 wt%)
|-
|-
|-style="background:LightGrey; color:black"
|-style="background:LightGrey; color:black"
!Process temperature
!Process temperature
|180 <sup>o</sup>C
|160 <sup>o</sup>C
|160 <sup>o</sup>C
|-
|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
|'''Possible masking materials'''
|'''Possible masking materials'''
|
*Thermal oxide (converted si-rich surface)
*LPCVD-oxide (TEOS)
*PECVD-oxide
|
|
*Thermal oxide (converted si-rich surface)
*Thermal oxide (converted si-rich surface)
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|-style="background:LightGrey; color:black"
!Etch rate
!Etch rate
|
*~85 Å/min (stoichiometric Si<sub>3</sub>N<sub>4</sub>)
*~60 Å/min (Si-rich Si<sub>3</sub>N<sub>4</sub>)
*~30 Å/min (annealed Si-rich Si<sub>3</sub>N<sub>4</sub>)
*~4 Å/min (Thermal oxide)
|
|
*~26 Å/min (Si-rich Si<sub>3</sub>N<sub>4</sub>)
*~26 Å/min (Si-rich Si<sub>3</sub>N<sub>4</sub>)
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|-style="background:WhiteSmoke; color:black"
!Selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>
!Selectivity R<sub>Si<sub>3</sub>N<sub>4</sub></sub> / R<sub>SiO<sub>2</sub></sub>
|~20
|The selectivity (sirich nitride:oxide) is higher at 160 <sup>o</sup>C than at 180 <sup>o</sup>C
|The selectivity (sirich nitride:oxide) is higher at 160 <sup>o</sup>C than at 180 <sup>o</sup>C
|-
|-
|-style="background:LightGrey; color:black"
|-style="background:LightGrey; color:black"
!Batch size
!Batch size
|
1-25 wafers at a time
|
|
1-25 wafer at a time
1-25 wafer at a time
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|-style="background:WhiteSmoke; color:black"
!Size of substrate
!Size of substrate
|
2-6" wafers
|
|
2-6" wafers
2-6" wafers
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|-style="background:LightGrey; color:black"
!Allowed materials
!Allowed materials
|
*Silicon
*Silicon nitrides
*Silicon oxides
|
|
*Silicon
*Silicon