Specific Process Knowledge/Lithography/PMMA: Difference between revisions
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The thickness is measured on VASE Ellipsometer using a simple Cauchy model for a transparent polymer on Si. The measurements are performed at one incidence angle (70 degrees) only. 9 points on each 4" wafer has been measured; the standard deviation thus representing the homogeinity of the film on the 4" wafers. | The thickness is measured on VASE Ellipsometer using a simple Cauchy model for a transparent polymer on Si. The measurements are performed at one incidence angle (70 degrees) only. 9 points on each 4" wafer has been measured; the standard deviation thus representing the homogeinity of the film on the 4" wafers. | ||
[[File:SpinCurvePMMA.jpg|right|600px]] | |||
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!colspan="7"|AllResist AR-P | !colspan="7"|AllResist AR-P 672.03 (PMMA) (~ 2ml per 4" wafer) spin coated on 'Spin Coater: Manual Standard Resists, E-5, WILTID & TIGRE, 26-10-2015. Softbake 3 min @ 150 degC. | ||
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|4000 | |||
|2000 | |2000 | ||
| | |95.55 | ||
|0.55 | |||
|0. | |||
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|5000 | |5000 | ||
| | |2000 | ||
| | |85.50 | ||
|0. | |0.92 | ||
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|7000 | |7000 | ||
| | |2000 | ||
| | |72.79 | ||
| | |1.18 | ||
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!colspan="7"|AllResist | !colspan="7"|AllResist AR-P 672.03 (PMMA) diluted 1:1 in Anisole (~ 2ml per 4" wafer) spin coated on 'Spin Coater: Manual Standard Resists, E-5, WILTID & TIGRE, 26-10-2015. Softbake 3 min @ 150 degC. | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|2000 | |2000 | ||
| | |2000 | ||
| | |51.37 | ||
|0. | |0.25 | ||
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|3000 | |3000 | ||
| | |2000 | ||
| | |41.97 | ||
|0. | |0.24 | ||
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|4000 | |4000 | ||
| | |2000 | ||
| | |36.25 | ||
|0. | |0.25 | ||
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Revision as of 14:19, 30 October 2015
Resist | Polarity | Manufacturer | Comments | Technical reports | Spinner | Developer | Rinse | Remover | Process flows (in docx-format) |
CSAR | Positive | AllResist | Standard positive resist, very similar to ZEP520. | Allresist_CSAR62_English.pdf,, CSAR_62_Abstract_Allresist.pdf | Manual Spinner 1 (Laurell), Spin Coater Labspin | XAR-600-546, XAR-600-548, N50, MIBK:IPA | IPA | AR-600-71, 1165 Remover | Process Flow CSAR.docx |
Spin Curves
The thickness is measured on VASE Ellipsometer using a simple Cauchy model for a transparent polymer on Si. The measurements are performed at one incidence angle (70 degrees) only. 9 points on each 4" wafer has been measured; the standard deviation thus representing the homogeinity of the film on the 4" wafers.
AllResist AR-P 672.03 (PMMA) (~ 2ml per 4" wafer) spin coated on 'Spin Coater: Manual Standard Resists, E-5, WILTID & TIGRE, 26-10-2015. Softbake 3 min @ 150 degC. | ||||||
---|---|---|---|---|---|---|
Spin Speed [rpm] | Acceleration [1/s2] | Thickness [nm] | St Dev | |||
4000 | 2000 | 95.55 | 0.55 | |||
5000 | 2000 | 85.50 | 0.92 | |||
7000 | 2000 | 72.79 | 1.18 |
AllResist AR-P 672.03 (PMMA) diluted 1:1 in Anisole (~ 2ml per 4" wafer) spin coated on 'Spin Coater: Manual Standard Resists, E-5, WILTID & TIGRE, 26-10-2015. Softbake 3 min @ 150 degC. | ||||||
---|---|---|---|---|---|---|
Spin Speed [rpm] | Acceleration [1/s2] | Thickness [nm] | St Dev | |||
2000 | 2000 | 51.37 | 0.25 | |||
3000 | 2000 | 41.97 | 0.24 | |||
4000 | 2000 | 36.25 | 0.25 |