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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
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|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface||[[File:Box1 no3 tilt0_28.jpg|200px]][[File:Box1 no3 tilt0_29.jpg|200px]]
|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface||[[File:Box1 no3 tilt0_28.jpg|200px]][[File:Box1 no3 tilt0_29.jpg|200px]]
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|Box1 no. 4||mattod||Used dirty sample, force curve very bad, tip probably broken||
|Box1 no. 4||mattod||Used dirty sample, force curve very bad, tip probably broken||[[File:Box1 no4 tilt21_10.jpg|200px]]
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|Box1 no. 5||mattod||Tip broken during tip change
|Box1 no. 5||mattod||Tip broken during tip change||[[File:Box1 no5 tilt21_20.jpg|200px]]
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|Box1 no. 6||abshir||Bad force curve (fluctuates)
|Box1 no. 6||abshir||Bad force curve (fluctuates)
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