Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

← Older editNewer edit →
VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Line 77: Line 77:
|Box1 no. 2||bghe/smurthy||Round pillars became misshaped||[[File:Box1 no2 tilt0ny2_55.jpg|200px]][[File:Box1 no2 tilt21_04.jpg|200px]]
|Box1 no. 2||bghe/smurthy||Round pillars became misshaped||[[File:Box1 no2 tilt0ny2_55.jpg|200px]][[File:Box1 no2 tilt21_04.jpg|200px]]
|-  
|-  
|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface
|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface||[[File:Box1 no3 tilt0_28.jpg|200px]][[File:Box1 no3 tilt0_29.jpg|200px]]
|-
|-
|Box1 no. 4||mattod||Used dirty sample, force curve very bad, tip probably broken
|Box1 no. 4||mattod||Used dirty sample, force curve very bad, tip probably broken||
|-
|-
|Box1 no. 5||mattod||Tip broken during tip change
|Box1 no. 5||mattod||Tip broken during tip change
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/Workspaces"