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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
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Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
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! SEM images
! SEM images
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|-  
|Box1 no. 1||bghe||A lot of triangles in the image||
|Box1 no. 1||bghe||A lot of triangles in the image||[[File:Box1 no1 tilt0_26.jpg|200px]][[File:Box1 no1 tilt0ny2_56.jpg|200px]]
|-
|-
|Box1 no. 2||bghe/smurthy||Round pillars became misshaped
|Box1 no. 2||bghe/smurthy||Round pillars became misshaped||[[File:Box1 no2 tilt0ny2_55.jpg|200px]][[File:Box1 no2 tilt21_04.jpg|200px]]
|-  
|-  
|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface
|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface
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