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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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! SEM images
! SEM images
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|Box1 no. 1||Col2_row1
|Box1 no. 1||bghe||A lot of triangles in the image||
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|Box1 no. 2||Col2_row2
|Box1 no. 2||bghe/smurthy||Round pillars became misshaped
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|Box1 no. 3||Col2_row3
|Box1 no. 3||bghe/zhongli||Force curve bad, could not get the tip off the surface
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|Box1 no. 4||Col2_row4
|Box1 no. 4||mattod||Used dirty sample, force curve very bad, tip probably broken
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|Box1 no. 5||
|Box1 no. 5||mattod||Tip broken during tip change
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|Box1 no. 6||
|Box1 no. 6||abshir||Bad force curve (fluctuates)
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|Box1 no. 7||
|Box1 no. 7||bghe||Was OK on large structures but they got larger
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|Box1 no. 8||
|Box1 no. 8||mattod||Bad force curve
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|Box1 no. 9||
|Box1 no. 9||kabi||Blunt tip . Definitely (triangles)
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|Box1 no. 10||
|Box1 no. 10||kabi||Blunt tip. Definitely (triangles)
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|Box2 no. 1||
|Box2 no. 1||mattod||Bad force curve
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|Box2 no. 2||
|Box2 no. 2||mattod||Broken tip
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