Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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 Please flowing this link to Brukers homepage:
 [http://www.bruker.com/products/surface-analysis/atomic-force-microscopy/modes/modes/nanoelectrical-modes/pf-kpfm.html pf-kpfm.html]
+=Evaluation of used probes=
+{| border="1" cellspacing="1" cellpadding="2"  align="left"
+! Box number and probe number
+! User Initials
+! Explanation
+! SEM images
+|-
+|Box1 no. 1||Col2_row1
+|-
+|Box1 no. 2||Col2_row2
+|-
+|Box1 no. 3||Col2_row3
+|-
+|Box1 no. 4||Col2_row4
+|-
+|Box1 no. 5||
+|-
+|Box1 no. 6||
+|-
+|Box1 no. 7||
+|-
+|Box1 no. 8||
+|-
+|Box1 no. 9||
+|-
+|Box1 no. 10||
+|-
+|Box2 no. 1||
+|-
+|Box2 no. 2||
+|-
+|}