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What scanning mode, experiment/workspace and probe should I select

	Roughness measurements	Topographic measurements with no steep/abrupt steps	Steep/abrupt steps but no high aspect ratio	High aspect ratio measurements
Recommended mode	Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend ScanAsyst mode because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use.	For Topographic measurements with no steep/abrupt steps we also recommend ScanAsyst mode due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use.	For Steep/abrupt steps but no high aspect ratio structures we still recommend ScanAsyst mode due to ease of use and lower top wear.	For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefore we recommend Tapping mode.
Recommended probes	ScanAsyst in air	ScanAsyst in air	ScanAsyst in air for ScanAsyst mode TAP300Al-G for Tapping mode	AR5T-NCHR FIB6-400A
Recommended experiment/Workspace	QNM in air*	QNM in air*	QNM in air*	TappingMode 300nm trench (for steps <~1µm) Tappping mode in air - 6µm Deep Trench (for steps >1~µm)

*By choosing the work space/experiment QNM in air (Mechanical properties - QNM in air) scanAsyst is included and so are the nanomechanical properties like modulus, adhesion, dissipation and deformation.

More information about de different modes

Contact, Tapping and Peak Force Tapping

Please flowing this link to Brukers homepage: Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf

PeakForce tapping and quantitative nanomechanical mapping

Please flowing this link to Brukers homepage: PeakForce tapping and Nanomechanical option

Peak Force KPFM (Kelvin Probe Force Microscopy)

Please flowing this link to Brukers homepage: pf-kpfm.html

Evaluation of used probes

Box number and probe number	User Initials	Explanation	SEM images
Box1 no. 1	Col2_row1
Box1 no. 2	Col2_row2
Box1 no. 3	Col2_row3
Box1 no. 4	Col2_row4
Box1 no. 5
Box1 no. 6
Box1 no. 7
Box1 no. 8
Box1 no. 9
Box1 no. 10
Box2 no. 1
Box2 no. 2

@@ Line 65: / Line 65: @@
 Please flowing this link to Brukers homepage:
 [http://www.bruker.com/products/surface-analysis/atomic-force-microscopy/modes/modes/nanoelectrical-modes/pf-kpfm.html pf-kpfm.html]
+=Evaluation of used probes=
+{| border="1" cellspacing="1" cellpadding="2"  align="left"
+! Box number and probe number
+! User Initials
+! Explanation
+! SEM images
+|-
+|Box1 no. 1||Col2_row1
+|-
+|Box1 no. 2||Col2_row2
+|-
+|Box1 no. 3||Col2_row3
+|-
+|Box1 no. 4||Col2_row4
+|-
+|Box1 no. 5||
+|-
+|Box1 no. 6||
+|-
+|Box1 no. 7||
+|-
+|Box1 no. 8||
+|-
+|Box1 no. 9||
+|-
+|Box1 no. 10||
+|-
+|Box2 no. 1||
+|-
+|Box2 no. 2||
+|-
+|}