Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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|Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend '''ScanAsyst mode''' because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | |Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend '''ScanAsyst mode''' because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | ||
|For Topographic measurements with no steep/abrupt steps we also recommend '''ScanAsyst mode''' due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | |For Topographic measurements with no steep/abrupt steps we also recommend '''ScanAsyst mode''' due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | ||
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''ScanAsyst mode''' due to ease of use | |For Steep/abrupt steps but no high aspect ratio structures we still recommend '''ScanAsyst mode''' due to ease of use and lower top wear. | ||
|For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefore we recommend '''Tapping mode'''. | |For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefore we recommend '''Tapping mode'''. | ||
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!Recommended experiment/Workspace | !Recommended experiment/Workspace | ||
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''' | '''QNM in air''' | ||
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''' | '''QNM in air''' | ||
|''' | |'''QNM in air''' | ||
|'''TappingMode 300nm trench''' (for steps <~1µm) | |'''TappingMode 300nm trench''' (for steps <~1µm) | ||
'''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm) | '''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm) | ||