Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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==More information about de different modes== | ==More information about de different modes== | ||
===Contact, Tapping and peak force tapping=== | |||
Please flowing this link to Brukers homepage: | Please flowing this link to Brukers homepage: | ||
[http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf] | [http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf] | ||
===PeakForce tapping and quantitative nanomechanical mapping=== | |||
Please flowing this link to Brukers homepage: | |||
[http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/Publications/AL_Foster_April2012.pdf PeakForce tapping and Nanomechanical option] | [http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/Publications/AL_Foster_April2012.pdf PeakForce tapping and Nanomechanical option] | ||
===Peak Force KPFM (Kelvin Probe Force Microscopy)=== | |||
Please flowing this link to Brukers homepage: | |||
[http://www.bruker.com/products/surface-analysis/atomic-force-microscopy/modes/modes/nanoelectrical-modes/pf-kpfm.html pf-kpfm.html] | |||
Revision as of 13:26, 24 October 2014
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What scanning mode, experiment/workspace and probe should I select
| Roughness measurements | Topographic measurements with no steep/abrupt steps | Steep/abrupt steps but no high aspect ratio | High aspect ratio measurements | |
|---|---|---|---|---|
| Recommended mode | Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend ScanAsyst mode because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | For Topographic measurements with no steep/abrupt steps we also recommend ScanAsyst mode due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use. | For Steep/abrupt steps but no high aspect ratio structures we still recommend ScanAsyst mode due to ease of use but it will scan slower than Tapping mode. | For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefor we recommend Tapping mode. |
| Recommended probes | ScanAsyst in air | ScanAsyst in air | ScanAsyst in air for ScanAsyst mode
TAP300Al-G for Tapping mode |
AR5T-NCHR |
| Recommended experiment/Workspace |
ScanAsyst in air - roughness (<10nm) |
ScanAsyst in air |
ScanAsyst in air - steps | TappingMode 300nm trench (for steps <~1µm)
Tappping mode in air - 6µm Deep Trench (for steps >1~µm) |
More information about de different modes
Contact, Tapping and peak force tapping
Please flowing this link to Brukers homepage: Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf
PeakForce tapping and quantitative nanomechanical mapping
Please flowing this link to Brukers homepage: PeakForce tapping and Nanomechanical option
Peak Force KPFM (Kelvin Probe Force Microscopy)
Please flowing this link to Brukers homepage: pf-kpfm.html