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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

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VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,317 edits
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'''ScanAsyst in air'''
'''ScanAsyst in air'''
|'''ScanAsyst in air - steep steps'''
|'''ScanAsyst in air - steps'''
|'''Tapping mode in air 300nm''' (for steps <~1µm)
|'''TappingMode 300nm trench''' (for steps <~1µm)
'''Tappping mode in air 6µm''' (for steps >1~µm)
'''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm)
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