Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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|'''ScanAsyst in air''' for ScanAsyst mode | |'''ScanAsyst in air''' for ScanAsyst mode | ||
'''TAP300Al-G''' for Tapping mode | '''TAP300Al-G''' for Tapping mode | ||
|'''AR5T-NCH''' | |'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR.html AR5T-NCH]''' | ||
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | '''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | ||
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