Jump to content

Specific Process Knowledge/Etch/KOH Etch: Difference between revisions

Bghe (talk | contribs)
No edit summary
Kabi (talk | contribs)
Line 129: Line 129:
*:[http://kemibrug.dk/KBA/CAS/106882/?show_KBA=1&portaldesign=1 see KBA here]
*:[http://kemibrug.dk/KBA/CAS/106882/?show_KBA=1&portaldesign=1 see KBA here]
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="4"|Performance
!style="background:silver; color:black" align="center" valign="center" rowspan="5"|Performance
|style="background:LightGrey; color:black"|Etch rates in crystalline silicon (100)
|style="background:LightGrey; color:black"|Etch rates in crystalline silicon (100)
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
Line 155: Line 155:
*1.2 nm/min (60 °C)  
*1.2 nm/min (60 °C)  
*6 nm/min (80 °C)
*6 nm/min (80 °C)
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
|-
|style="background:LightGrey; color:black"|Etch rates in SiN
|style="background:WhiteSmoke; color:black"|
*0.02 nm/min (80 °C)<sup>{{fn|1}}</sup>
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
Line 270: Line 277:
|-
|-
|}
|}
 
<sup>{{fn|1}}</sup> Measured by Eric Jensen from DTU-Nanotech, October 2013.
<br clear="all" />
<br clear="all" />