Specific Process Knowledge/Thin film deposition/Deposition of Silicon Oxide/Deposition of Silicon Oxide using PECVD: Difference between revisions
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|HF SiO<!-- Recipe --> | |HF SiO<!-- Recipe --> | ||
| | |63-64 nm/min<!-- Dep. rate [nm/min] --> | ||
|1. | |1.476-1.477<!-- RI --> | ||
|± 3 | |± 0.3-0.5%<!-- Unif. [%] --> | ||
|Compressive: | |Compressive: 250.5 MPa<!-- Stress [MPa] --> | ||
|<!-- Comments --> | |<!-- Comments --> | ||
| | |10<!-- SiH4 [sccm] --> | ||
| | |<!-- NH3 [sccm] --> | ||
|<!-- N2O [sccm] --> | |1420<!-- N2O [sccm] --> | ||
| | |392<!-- N2 [sccm] --> | ||
| | |900 mTorr<!-- Pressure [mTorr] --> | ||
| | |30HF<!-- Power [W] --> | ||
|<!-- Load --> | |<!-- Load --> | ||
|<!-- Tune --> | |<!-- Tune --> | ||
|2:00/ | |2:00/16:00(stress)<!-- Time [mm:ss] --> | ||
|February 2017 bghe<!--Tested --> | |February 2017 bghe<!--Tested --> | ||
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