Specific Process Knowledge/Characterization/Dektak 150: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Dektak_150 click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Dektak_150 click here]''' | ||
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[[ | [[Category:Equipment|Characterization Profiler]] | ||
[[ | [[Category:Characterization|Profiler]] | ||
= Stylus Profiler | = Dektak150 (Stylus Profiler) = | ||
[[image:Dektak150.JPG|300x300px|right|thumb|Stylus profiler:Dektak150, currently located in building 451, room 913 (as of 2023).]] | [[image:Dektak150.JPG|300x300px|right|thumb|Stylus profiler:Dektak150, currently located in building 451, room 913 (as of 2023).]] | ||
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Info about measurement accuracy can be found [//Dektak_XTA <b>here</b>] (''measured with Dektak XTA''). | Info about measurement accuracy can be found [//Dektak_XTA <b>here</b>] (''measured with Dektak XTA''). | ||
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===Performance and Process Parameters=== | |||
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