Specific Process Knowledge/Characterization/XPS: Difference between revisions
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{{Template:Author-jmli1}} | |||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XPS click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XPS click here]''' | ||
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==The XPS tools at DTU Nanolab== | ==The XPS tools at DTU Nanolab== | ||
[[Image:XPS K-Alpha.jpg | | [[Image:XPS K-Alpha.jpg |thumb|x300px|The K-Alpha from 2007 is one of the first instruments of this type that was produced.{{photo1}} ]] | ||
[[Image:XPS Nexsa.png | | [[Image:XPS Nexsa.png |thumb|x300px|The Nexsa from 2019 is on the surface very similar to the K-Alpha. Its panels, however, hide a whole range of supplementary techniques.{{photo1}} ]] | ||
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== Analyzing XPS spectra == | == Analyzing XPS spectra == | ||
The analysis of XPS spectra is an art in itself. | The analysis of XPS spectra is an art in itself. It can be done using various software packages available on the internet. In the links below we will focus on two such examples, Avantage and CasaXPS. | ||
*[[Specific Process Knowledge/Characterization/XPS/Processing|Processing XPS data]] | *[[Specific Process Knowledge/Characterization/XPS/SoftwareInstall|How to access XPS software: Download/install or by access to server]] | ||
*[[Specific Process Knowledge/Characterization/XPS/Processing|Processing XPS data with Avantage]] | |||
*[[Specific Process Knowledge/Characterization/XPS/Export2CasaXPS | Export Avantage data to CasaXPS]] | |||
==Techniques and option on the XPS tools== | ==Techniques and option on the XPS tools== | ||
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!style="background:silver; color:black;" align="left" colspan="2"|Equipment | !style="background:silver; color:black;" align="left" colspan="2"|Equipment | ||
!style="background:silver; color:black;" align="left" |[[Specific Process Knowledge/Characterization/XPS/K-Alpha |K-Alpha]] | !style="background:silver; color:black;" align="left" |[[Specific Process Knowledge/Characterization/XPS/K-Alpha |XPS K-Alpha (Manufactured by Thermofisher)]] | ||
!style="background:silver; color:black;" align="left" |[[Specific Process Knowledge/Characterization/XPS/Nexsa |Nexsa]] | !style="background:silver; color:black;" align="left" |[[Specific Process Knowledge/Characterization/XPS/Nexsa |XPS Nexsa (Manufactured by Thermofisher)]] | ||
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!style="background:silver; color:black;" align="left" rowspan="2"|Purpose | !style="background:silver; color:black;" align="left" rowspan="2"|Purpose | ||
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|style="background:LightGrey; color:black"|Alternative/complementary | |style="background:LightGrey; color:black"|Alternative/complementary | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* | * Work function measurements | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
* | * Work function measurements | ||
* Ultraviolet Photoelectron Spectroscopy (UPS) with He I and He II UV source | * [[Specific Process Knowledge/Characterization/XPS/UPS technique| Ultraviolet Photoelectron Spectroscopy (UPS) with He I and He II UV source]] | ||
* Ion Scattering Spectroscopy | * [[Specific Process Knowledge/Characterization/XPS/ISS|Ion Scattering Spectroscopy or ISS]] | ||
* Reflected Electron Energy Loss Spectroscopy | * [[Specific Process Knowledge/Characterization/XPS/REELS|Reflected Electron Energy Loss Spectroscopy or REELS]] | ||
* Angular Resolved Ultraviolet Photoelectron Spectroscopy (ARUPS) | * Angular Resolved Ultraviolet Photoelectron Spectroscopy (ARUPS) | ||
* [[Specific Process Knowledge/Characterization/XPS/Raman|Raman spectroscopy]] | |||
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!rowspan="5" style="background:silver; color:black" align="left"| Performance | !rowspan="5" style="background:silver; color:black" align="left"| Performance | ||