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{{:Specific Process Knowledge/Lithography/authors_generic}}
 
'''Feedback to this page''': '''[mailto:lithography@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php?title=Specific_Process_Knowledge/Lithography/PMMA click here]'''
 
 
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|-style="background:Black; color:White"
|-style="background:black; color:white"
|'''Resist'''
|'''Resist'''
|'''Polarity'''
|'''Polarity'''
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|'''Technical reports'''
|'''Technical reports'''
|'''Spinner'''
|'''Spinner'''
|'''Thinner'''
|'''Developer'''
|'''Developer'''
|'''Rinse'''
|'''Rinse'''
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|-style="background:WhiteSmoke; color:black"
|'''[[Specific_Process_Knowledge/Lithography/CSAR|CSAR]]'''
|'''[[Specific_Process_Knowledge/Lithography/PMMA|PMMA]]'''
|Positive
|Positive
|[http://www.allresist.com AllResist]
| [http://www.allresist.com AllResist]
|Standard positive resist, very similar to ZEP520.
|We have various types of PMMA in the cleanroom. Please contact [mailto:Lithography@danchip.dtu.dk Lithography] for information.
|[[media:Allresist_CSAR62_English.pdf‎|Allresist_CSAR62_English.pdf‎]],, [[media:CSAR_62_Abstract_Allresist.pdf‎|CSAR_62_Abstract_Allresist.pdf‎]]
| [[media:MSDS PMMA.pdf|MSDS PMMA]], [[media:AR-P631_679.pdf|Processing guidelines]]
|[[Specific_Process_Knowledge/Lithography/Coaters#Manual Spinner 1|Manual Spinner 1 (Laurell)]], [[Specific_Process_Knowledge/Lithography/Coaters#Spin_coater:_Manual_Labspin|Spin Coater Labspin]]
|See table <u>[[Specific_Process_Knowledge/Lithography/Coaters#Coaters:_Comparison_Table|here]] </u>
|XAR-600-546, XAR-600-548, N50, MIBK:IPA
|Anisole
|IPA:H2O (7:3), MIBK:IPA (1:3)
|IPA
|IPA
|AR-600-71, 1165 Remover
|acetone/1165
|[[media:Process_Flow_CSAR.docx‎|Process Flow CSAR.docx‎]]
|
 
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|}


<br><br>


== Spin Curves ==
== Spin Curves ==




The thickness is measured on VASE Ellipsometer using a simple Cauchy model for a transparent polymer on Si. The measurements are performed at one incidence angle (70 degrees) only. 9 points on each 4" wafer has been measured; the standard deviation thus representing the homogeinity of the film on the 4" wafers.  
The thickness is measured on VASE Ellipsometer using a simple Cauchy model for a transparent polymer on Si. The measurements are performed at one incidence angle (70 degrees) only. 9 points on each 4" wafer has been measured; the standard deviation thus representing the homogeinity of the film on the 4" wafers. Please notice, that the spinning curves were made in 2015.  




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|-style="background:silver; color:black"
!Spin Speed [rpm]
!Spin Speed [rpm]
!Acceleration [1/s2]
!Acceleration [rpm/s]
!Thickness [nm]
!Thickness [nm]
!St Dev
!St Dev
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|-style="background:silver; color:black" style="text-align:left;"  
|-style="background:silver; color:black" style="text-align:left;"  
!Spin Speed [rpm]
!Spin Speed [rpm]
!Acceleration [1/s2]
!Acceleration [rpm/s]
!Thickness [nm]
!Thickness [nm]
!St Dev
!St Dev
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