Specific Process Knowledge/Lithography/Pretreatment: Difference between revisions

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'''Feedback to this page''': '''[mailto:photolith@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Pretreatment click here]'''
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Pretreatment click here]'''
 
[[Category: Equipment|Pretreatment]]
[[Category: Lithography|Pretreatment]]


=Pretreatment=
=Pretreatment=
All surfaces can be divided to hydrophilic or hydrophobic surfaces, where the oxidized surfaces such SiO2 or surface with native oxide formation on Si or Al substrates consider to be hydrophilic and have very bad wetting with hydrophobic resist.
Pretreatment, also known as ''priming'', is done before spin coating in order to ensure the best conditions for adhesion between the substrate surface and the resist. Pretreatment ranges from a simple dehydration bake over etching the native oxide to vapor phase deposition of an adhesion promoter. The goal of pretreatment is to remove any moisture that may be adsorbed on the surface of the substrate, and/or to modify the contact angle of the surface to match that of the resist to be coated on the substrate.
 
All surfaces can be divided to hydrophilic or hydrophobic surfaces. Oxidized surfaces such as SiO<sub>2</sub> or surfaces with native oxide (e.g. Si or Al substrates) are considered to be hydrophilic and have very bad wetting with hydrophobic resist. The adhesion of most resists on hydrophilic surfaces is deteriorated if moisture is present on the surface. Therefore it is very important to do the pretreatment step before spin coating. This page gives an overview of treatments available at DTU Nanolab to promote photoresist adhesion.
 
==Dehydration==
A dehydration bake immediately before spin coating removes the moisture adsorbed to the surface, and greatly improves the adhesion of resist on most surfaces. For thin hydrophilic layers, a few minutes on a hotplate at or above 100°C may suffice. For thicker layers or bulk oxide samples, a dehydration bake at 250°C over night is recommended. Due to the moisture in the cleanroom atmosphere, this priming naturally has a short shelf life, so spin coating should be done as soon as possible.


Therefore it is very important to do the pretreatment step before the spinning. Here we will give an overview of treatments available at Danchip to promote photoresist adhesion.
==BHF dip==
Stripping the native oxide using BHF only works if the native oxide of the substrate is etched by BHF, and if resist has good adhesion to the substrate material itself, which basically limits it to silicon. A BHF dip leaves the surface of a silicon wafer hydrophobic, and the dangling Si-bonds are passivated by adsorbed H<sup>+</sup>. This means the surface will not oxidize immediately, but the lifetime of this passivation is limited, so it is recommended to spin coat the wafer within 20, maximum 45 minutes.
 
==HMDS==
In the HMDS priming process, the -OH groups on the surface of the substrate are replaced with Si(CH<sub>3</sub>)<sub>3</sub>, thus changing the surface from hydrophilic to (more) hydrophobic. Substrates with surfaces of silicon, or its oxides/nitrides, all work very well with HMDS pretreatment.
 
Other semiconductors, insulators, or metals that form -OH groups on the surface may be suitable as well. The shelf life of substrates primed using HMDS (vapor phase) is long, maybe even several weeks.
 
==Dip/spin-on adhesion promoter==
Adhesion promoters for dip or spin-on application are commercially available. Most are solvent based with some, usually proprietary, additives. They work by first cleaning the substrate surface, and subsequently priming the surface with the additives as the solvent evaporates.
 
==Hard bake==
If the adhesion between the substrate surface and the resist is sufficient to survive the development process without delamination, the adhesion in subsequent process steps can be improved by a so-called hard bake. Baking the substrate a few minutes on  a hotplate (or approx. half an hour in a convection oven) at a temperature higher than the soft bake temperature, e.g. 110-130°C, usually improves the adhesion between resist and surface. Depending on the type of resist used, and the temperature of the hard bake, reflow of the resist pattern may be a side effect.


==Comparing pretreatment methods==
==Comparing pretreatment methods==


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{|border="1" cellspacing="1" cellpadding="10" style="text-align:left;"  
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|-style="background:silver; color:black"
!
!
![[Specific Process Knowledge/Lithography/Pretreatment#HMDS|HMDS]]
![[Specific Process Knowledge/Lithography/Pretreatment#HMDS_2|HMDS]]
![[Specific Process Knowledge/Lithography/Pretreatment#HMDS|BHF]]
![[Specific Process Knowledge/Lithography/Pretreatment#Buffered HF-Clean|Buffered HF-Clean]]
![[Specific Process Knowledge/Lithography/Pretreatment#Oven 250C|Oven 250C]]
![[Specific Process Knowledge/Lithography/Pretreatment#Oven 250C|Oven 250C]]
|-
|-
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!Generel description
!Generel description
|
|
*Isotropic etch
Vapor priming
|
|
*Anisotropic etch: vertical sidewalls
Native oxide strip
|
|
*Anisotropic etch: vertical sidewalls
Dehydration
|-
|-


|-
|-
|-style="background:LightGrey; color:black"
|-style="background:LightGrey; color:black"
!Possible masking materials
!Chemical
|
hexamethyldisilazane (HMDS)
|
12%HF with Ammoniumflouride
|
none
|-
 
|-
|-style="background:WhiteSmoke; color:black"
!Substrate size
|
|
* Chips
* 50 mm wafers
* 100 mm wafers
* 150 mm wafers
|
* 100 mm wafers
|
* 100 mm wafers
* 150 mm wafers
|-
|-style="background:LightGrey; color:black"
!Allowed materials
|
Silicon, glass, and polymer substrates (Tg > 150°C)
Film or pattern of all types, except type IV and resist/polymer
|
*Silicon
*Poly Silicon
*Silicon Oxide
*Silicon Nitride
*Silicon Oxynitride
*Photoresist
*Photoresist
*PolySilicon
*Silicon nitride (LPCVD)
*Blue film
*Blue film
*Cr/Au for deeper etches (plastic beaker)
|
|
*Photoresist
*Silicon
*DUV resist
*E-beam resist
*Silicon Oxide
*Silicon Oxide
*Silicon Nitride
*Silicon Nitride
*Metals if they cover less than 5% of the wafer area (ONLY RIE2!)
*Glass
|-
|-style="background:WhiteSmoke; color:black"
!Restrictions
|Type IV and resist/polymer on polymer substrate
 
i.e. no resist coated wafers or crystalbonded chips!
|Wafers with metal is not allowed
|Resist is not allowed
|-
|}
 
<br clear="all" />
 
==Pretreatment of various surfaces==
 
'''General comment regarding III-V materials:'''
 
A dehydration bake prior to spin coating can be enough, especially if adhesion is not critical, and if the resist is not left more than a day or two on the surface. Application of dip/spin-on adhesion promoter can improve the adhesion and shelf life. If adhesion is critical in the subsequent process step, application of a thin layer of SiO<sub>2</sub> using PECVD (followed by HMDS priming) as an adhesion layer is recommended.
 
Overview of what pretreatment is used for various surfaces at DTU Nanolab. Parentheses () indicate the method is not the optimal choice, or that the information is taken from product information supplied by manufacturers.
 
{|border="1" cellspacing="1" cellpadding="10" style="text-align:left;"
|-
 
|-
|-style="background:silver; color:black"
|
|
*Photoresist
|'''Dehydration'''
*DUV resist
|'''BHF dip'''
*E-beam resist
|'''HMDS'''
*Silicon Oxide
|'''Dip/spin-on adhesion promoter'''
*Silicon Nitride
|'''Comment'''
*Aluminium
*Chromium (Please try to avoid this)
|-
|-


|-
|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!Etch rate range
|'''Silicon with native oxide'''
|align="center"|(X)
|align="center"|X
|align="center"|X
|align="center"|(X)
|
|
*~75 nm/min (Thermal oxide) in BHF
|-
*~90 nm/min (Thermal oxide) in SIO Etch
 
*~25 nm/min (Thermal oxide) in 5%HF
|-
*~3-4µm/min in 40%HF
|-style="background:silver; color:black"
|'''Silicon oxide'''
|align="center"|(X)
|align="center"|
|align="center"|X
|align="center"|(X)
|
|
*Process dependent
|-
*Tested range: ~20nm/min - ~120nm/min
 
|-
|-style="background:WhiteSmoke; color:black"
|'''Silicon nitride'''
|align="center"|(X)
|align="center"|
|align="center"|X
|align="center"|(X)
|
|
*Process dependent
*Tested range: ~230nm/min - ~550nm/min
|-
|-


|-
|-
|-style="background:LightGrey; color:black"
|-style="background:silver; color:black"
!Substrate size
|'''Glass (borofloat/pyrex)'''
|align="center"|X
|align="center"|
|align="center"|X
|align="center"|(X)
|Dehydration before HMDS is probably best
|-
 
|-
|-style="background:WhiteSmoke; color:black"
|'''Fused silica (quartz)'''
|align="center"|X
|align="center"|
|align="center"|X
|align="center"|(X)
|Dehydration before HMDS is probably best
|-
 
|-
|-style="background:silver; color:black"
|'''InGaAs'''
|align="center"|(X)
|align="center"|
|align="center"|
|align="center"|SurPass 3000
|
|
hmds
|-
 
|-
|-style="background:WhiteSmoke; color:black"
|'''GaAs'''
|align="center"|(X)
|align="center"|
|align="center"|
|align="center"|SurPass 3000
|
|
bhf
|-
 
|-
|-style="background:silver; color:black"
|'''GaP'''
|align="center"|(X)
|align="center"|
|align="center"|
|align="center"|?
|AR800-30 is being tested (leaves residue)
|-
 
|-
|-style="background:WhiteSmoke; color:black"
|'''InP'''
|align="center"|(X)
|align="center"|
|align="center"|
|align="center"|?
|AR800-30 is being tested (leaves residue)
|-
 
|-
|-style="background:silver; color:black"
|'''GaN'''
|align="center"|(X)
|align="center"|
|align="center"|
|align="center"|?
|
|
250c
|-
|-


|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!Allowed materials
|'''InN'''
|align="center"|(X)
|align="center"|
|align="center"|
|align="center"|?
|
|
hmds
|
bhf
|
250c
|-
|-
|}
|}
 
<br>
The information on III-V materials has been provided by Kresten Yvind at DTU Fotonik June 2021.
<br clear="all" />
<br clear="all" />


=HMDS=
=HMDS=
'''Feedback to this section''': '''[mailto:photolith@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Pretreatment#HMDS click here]'''
The chemical treatment with hexamethyldisilazane (HMDS) before the spin coating can be used to promote the adhesion for photoresist. Vapor priming with HMDS leaves a mono-layer of TMS (trimethylsilyl) on the Si or SiO<sub>2</sub> surface. The process dehydrates the substrate surface, and lowers the surface energy to promote better wetting.


The chemical treatment with hexamethyldisilazane (HMDS) before the spin coating can be used to promote the adhesion for photoresist. HMDS treatment leaves a mono-layer of TMS (trimethylsilyl) on the Si or SiO<sub>2</sub> surface.
The molecular formula for hexamethyldisilazane, or bis(trimethylsilyl)amine, is C<sub>6</sub>H<sub>19</sub>NSi<sub>2</sub>.


The molecular formula for hexamethyldisilazane, or bis(trimethylsilyl)amine, is C<sub>6</sub>H<sub>19</sub>NSi<sub>2</sub>. Here is a schematic overview of HMDS treatment of silicon-oxide surface.
[[File:HMDS priming schematic.png|640px|thumb|right|Schematic of the HMDS vapor priming process]]
 
[[Image:HMDS.jpg|500x500px|thumb|left|Priming of oxide-forming substrates by HMDS treatment.]]


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==Comparing HMDS priming==
==Comparing HMDS priming==


{| border="2" cellspacing="0" cellpadding="2"  
{|border="1" cellspacing="1" cellpadding="10" style="text-align:left;"  


!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment  
!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment  
|style="background:WhiteSmoke; color:black" align="center"|<b>[[Specific_Process_Knowledge/Lithography/Pretreatment#HMDS oven|HMDS oven]]</b>
 
|style="background:WhiteSmoke; color:black" align="center"|<b>[[Specific_Process_Knowledge/Lithography/Coaters#Spin Track 1 + 2|Spin Track 1 + 2]]</b>
|style="background:WhiteSmoke; color:black" align="center"|<b>[[Specific_Process_Knowledge/Lithography/Pretreatment#Oven: HMDS 2|Oven: HMDS 2]]</b>
|style="background:WhiteSmoke; color:black" align="center"|<b>[[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_UV|Gamma UV]]/ [[Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_E-beam_and_UV|Gamma e-beam and  UV]]</b>
|-
|-
!style="background:silver; color:black;" align="center" width="60"|Purpose  
!style="background:silver; color:black;" align="center" width="60"|Purpose  
|style="background:LightGrey; color:black"|
|style="background:LightGrey; color:black"|
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* HMDS priming


* HMDS priming only
|style="background:WhiteSmoke; color:black"|
|style="background:WhiteSmoke; color:black"|
* HMDS priming only
* HMDS priming only
* HMDS priming and spin coating
* HMDS priming and spin coating
Line 126: Line 279:
!style="background:silver; color:black;" align="center" width="60"|Priming chemical  
!style="background:silver; color:black;" align="center" width="60"|Priming chemical  
|style="background:LightGrey; color:black"|
|style="background:LightGrey; color:black"|
|style="background:WhiteSmoke; color:black" align="center" colspan="2"|
|style="background:WhiteSmoke; color:black" align="center" colspan="4"|
hexamethyldisilizane (HMDS)
hexamethyldisilazane (HMDS)
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="1"|Performance
!style="background:silver; color:black" align="center" valign="center" rowspan="1"|Performance
|style="background:LightGrey; color:black"|Contact angle
|style="background:LightGrey; color:black"|Contact angle
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
standard recipe 82° (on SiO<sub>2</sub>)
* Si (native oxide): 77.8°
|style="background:WhiteSmoke; color:black" align="center"|
* SiO<sub>2</sub> (110 nm): 81.7°
60° - 90°; standard recipe 82° (on SiO<sub>2</sub>)
* Boron Glass: 97.6°
|style="background:WhiteSmoke; color:black"|
Fast recipe [standard recipe]:
* Si (native oxide): 72.9° [81.0°]
* SiO<sub>2</sub> (110 nm): 71.0° [79.7°]
* Boron Glass: 90.7° [96.2°]
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Process parameters
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Process parameters
|style="background:LightGrey; color:black"|Process temperature
|style="background:LightGrey; color:black"|Process temperature
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
150°C
150°C
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
50°C
120°C
|-
|-
|style="background:LightGrey; color:black"|Process time
|style="background:LightGrey; color:black"|Process time
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
32.5 minutes
 
|style="background:WhiteSmoke; color:black" align="center"|
25 minutes
3 min / wafer
|style="background:WhiteSmoke; color:black"|
 
1-2 min / wafer
|-
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
|style="background:LightGrey; color:black"|Substrate size
|style="background:LightGrey; color:black"|Substrate size
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
 
* Chips (using holder or silicon carrier)
* 50 mm wafers
* 50 mm wafers
* 100 mm wafers
* 100 mm wafers
* 150 mm wafers
* 150 mm wafers
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
100 mm wafers
 
* 50 mm wafers (tool change required)
* 100 mm wafers
* 150 mm wafers
* 200 mm wafers (tool change required)
|-
|-
| style="background:LightGrey; color:black"|Allowed materials
| style="background:LightGrey; color:black"|Allowed materials
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
All cleanroom materials
 
|style="background:WhiteSmoke; color:black" align="center"|
Silicon, glass, and polymer substrates
Silicon (with oxide, nitride, or metal films or patterning)
 
III-V materials on silicon carrier
 
Film or pattern of all but types, except type IV and resist/polymer (incl. Crystalbond)
|style="background:WhiteSmoke; color:black"|
 
Silicon and glass wafers


Glass (borosilicate and quartz)
Film or pattern of all but types, except type IV and resist/polymer (incl. Crystalbond)
|-
|-
|style="background:LightGrey; color:black"|Batch
|style="background:LightGrey; color:black"|Batch
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
 
1 - 25, multiple batches possible
1 - 25, multiple batches possible
|style="background:WhiteSmoke; color:black" align="center"|
|style="background:WhiteSmoke; color:black"|
 
1 - 25
1 - 25
|-  
|-  
|}
|}
<br>
'''Contact angle:'''<br>
The contact angle of the substrate surface can be measured using the [[Specific_Process_Knowledge/Characterization/Drop_Shape_Analyzer|Drop Shape Analyzer]].


<br clear="all" />
<br clear="all" />


==HMDS oven==
==Oven: HMDS 2==
[[Image:HMDS2.jpg|300x300px|thumb|The Oven: HMDS 2 oven is located in E-5.]]


[[Image:HMDS1.JPG|300x300px|thumb|The HMDS oven is placed in Cleanroom 3.]]
The user manual, user APV, and contact information can be found in LabManager:


At Danchip we use Star2000 model from IMTEC to do vapor deposition of hexamethyldisilizane (HMDS) under the special conditions: low pressure and high chamber temperature. The result of the dehydration bake and HMDS prime is that the wafers become hydrophobic after the treatment.
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=358 Oven: HMDS 2] - '''requires login'''


'''The user manual, user APV, and contact information can be found in LabManager:'''


[http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=54 HMDS oven in LabManager]
'''Process information:'''
*Recipe 1: baseline prime process with 5 min HMDS priming time


===Process information===
<br clear="all" />


*Recipe 4: baseline prime process with 5 min priming time
==Spin Coater: Gamma UV==
[[Image:HMDS gammaUV.jpg|300x300px|thumb|HMDS module (top) in Spin Coater: Gamma UV in E-5.]]


The user manual, user APV, and contact information can be found in LabManager:


'''Baseline prime process description:'''
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=359 Spincoater: Gamma UV] - '''requires login'''


1. Vacuum, 2 min


2. Nitrogen pump, 3.5 min
Additional information about the spin coater and processes can be found in Labadviser:


3. Heat- up, 10 min
[http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_UV Spin Coater: Gamma UV]


4. Vacuum, 4.5 min
<br clear="all" />


5. HMDS prime, 5 min
==Spin Coater: Gamma e-beam & UV==


6. Vacuum chamber exhaust, 3 min
[[image:Gamma_4M_-_E-beam_&_UV_full.JPG|300x300px|thumb|Spin Coater: Gamma e-beam & UV in E-5.]]


7. Nitrogen back-fill, 3.5 min
The user manual, user APV, and contact information can be found in LabManager:


===Equipment performance and process related parameters===
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=417 Spin Coater: Gamma e-beam & UV] - '''requires login'''


{| border="2" cellspacing="0" cellpadding="2"


!style="background:silver; color:black;" align="center" width="60"|Purpose
Additional information about the spin coater and processes can be found in Labadviser:
|style="background:LightGrey; color:black"|
|style="background:WhiteSmoke; color:black" align="center"|
Promotion of photoresist adhesion


by hydrophobization
[http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Lithography/Coaters#Spin_Coater:_Gamma_E-beam_and_UV Spin Coater: Gamma e-beam & UV]
|-
!style="background:silver; color:black;" align="center" width="60"|Chemical
|style="background:LightGrey; color:black"|
|style="background:WhiteSmoke; color:black" align="center"|
hexamethyldisilizane
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="1"|Performance
|style="background:LightGrey; color:black"|Contact angle
|style="background:WhiteSmoke; color:black" align="center"|
82° (on SiO<sub>2</sub>)
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Process parameters
|style="background:LightGrey; color:black"|Process temperature
|style="background:WhiteSmoke; color:black" align="center" colspan="2"|
150 °C
|-
|style="background:LightGrey; color:black"|Process time
|style="background:WhiteSmoke; color:black" align="center" colspan="2"|
32.5 minutes
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
|style="background:LightGrey; color:black"|Substrate size
|style="background:WhiteSmoke; color:black" align="center" colspan="2"|
* 50 mm wafers
* 100 mm wafers
* 150 mm wafers
|-
| style="background:LightGrey; color:black"|Allowed materials
|style="background:WhiteSmoke; color:black" align="center" colspan="2"|
All cleanroom materials
|-
|style="background:LightGrey; color:black"|Batch
|style="background:WhiteSmoke; color:black" align="center" colspan="2"|
1 - 25, multiple batches possible
|-  
|}


<br clear="all" />
<br clear="all" />


=Buffered HF-Clean=
=Buffered HF-Clean=
[[Image:BHF_RR3.jpg|300x300px|thumb|BHF: positioned in cleanroom 3]]
[[image:BHF clean.JPG|300x300px|thumb||BHF clean wetbench 04 in D-3.]]


Another commonly used method to render the surface of silicon wafers hydrophobic is the dilute HF dip.
Another commonly used method to render the surface of silicon wafers hydrophobic is the dilute HF dip.


BHF is mostly used to do pretreatment step for new Si wafers. The native dioxide layer will be removed during 30 sec etching and in this way we will promote the resist adhesion on the Si substrates. We recommend to spin resist asap after the procedure.
BHF is mostly used to do pretreatment for new Si wafers.<br>
The native oxide layer will be removed by 30 seconds of etching and this will promote the resist adhesion on the Si substrates. We recommend to spin coat resist as soon as possible after the procedure.
 
 
The user manual, user APV, and contact information can be found in LabManager:
 
[https://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=378 Buffered HF-Clean in LabManager] - '''requires login'''
 
 
Additional information about the spin coater and processes can be found in Labadviser:
 
[[Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF)|Wet Silicon Oxide Etch (BHF)]]
 
<br clear="all" />
<br clear="all" />


=Oven 250C=
{{:Specific Process Knowledge/Lithography/Pretreatment/Oven_250C}}
[[Image:Oven_250_degrees_for_pretreatment_cr3.jpg|300x300px|thumb|250 degrees oven for pretreatment: positioned in cleanroom 3]]
The oven is typically used for pretreatment (dehydration) of Si and glass substrates to promote the resist adhesion. We recommend to place the wafers in metal carrier in the oven at least for 4 hours, better during the night, and spin the resist on them asap.

Latest revision as of 11:06, 19 March 2024

The contents on this page, including all images and pictures, was created by DTU Nanolab staff unless otherwise stated.

Feedback to this page: click here

Pretreatment

Pretreatment, also known as priming, is done before spin coating in order to ensure the best conditions for adhesion between the substrate surface and the resist. Pretreatment ranges from a simple dehydration bake over etching the native oxide to vapor phase deposition of an adhesion promoter. The goal of pretreatment is to remove any moisture that may be adsorbed on the surface of the substrate, and/or to modify the contact angle of the surface to match that of the resist to be coated on the substrate.

All surfaces can be divided to hydrophilic or hydrophobic surfaces. Oxidized surfaces such as SiO2 or surfaces with native oxide (e.g. Si or Al substrates) are considered to be hydrophilic and have very bad wetting with hydrophobic resist. The adhesion of most resists on hydrophilic surfaces is deteriorated if moisture is present on the surface. Therefore it is very important to do the pretreatment step before spin coating. This page gives an overview of treatments available at DTU Nanolab to promote photoresist adhesion.

Dehydration

A dehydration bake immediately before spin coating removes the moisture adsorbed to the surface, and greatly improves the adhesion of resist on most surfaces. For thin hydrophilic layers, a few minutes on a hotplate at or above 100°C may suffice. For thicker layers or bulk oxide samples, a dehydration bake at 250°C over night is recommended. Due to the moisture in the cleanroom atmosphere, this priming naturally has a short shelf life, so spin coating should be done as soon as possible.

BHF dip

Stripping the native oxide using BHF only works if the native oxide of the substrate is etched by BHF, and if resist has good adhesion to the substrate material itself, which basically limits it to silicon. A BHF dip leaves the surface of a silicon wafer hydrophobic, and the dangling Si-bonds are passivated by adsorbed H+. This means the surface will not oxidize immediately, but the lifetime of this passivation is limited, so it is recommended to spin coat the wafer within 20, maximum 45 minutes.

HMDS

In the HMDS priming process, the -OH groups on the surface of the substrate are replaced with Si(CH3)3, thus changing the surface from hydrophilic to (more) hydrophobic. Substrates with surfaces of silicon, or its oxides/nitrides, all work very well with HMDS pretreatment.

Other semiconductors, insulators, or metals that form -OH groups on the surface may be suitable as well. The shelf life of substrates primed using HMDS (vapor phase) is long, maybe even several weeks.

Dip/spin-on adhesion promoter

Adhesion promoters for dip or spin-on application are commercially available. Most are solvent based with some, usually proprietary, additives. They work by first cleaning the substrate surface, and subsequently priming the surface with the additives as the solvent evaporates.

Hard bake

If the adhesion between the substrate surface and the resist is sufficient to survive the development process without delamination, the adhesion in subsequent process steps can be improved by a so-called hard bake. Baking the substrate a few minutes on a hotplate (or approx. half an hour in a convection oven) at a temperature higher than the soft bake temperature, e.g. 110-130°C, usually improves the adhesion between resist and surface. Depending on the type of resist used, and the temperature of the hard bake, reflow of the resist pattern may be a side effect.

Comparing pretreatment methods

HMDS Buffered HF-Clean Oven 250C
Generel description

Vapor priming

Native oxide strip

Dehydration

Chemical

hexamethyldisilazane (HMDS)

12%HF with Ammoniumflouride

none

Substrate size
  • Chips
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
  • 100 mm wafers
  • 100 mm wafers
  • 150 mm wafers
Allowed materials

Silicon, glass, and polymer substrates (Tg > 150°C)

Film or pattern of all types, except type IV and resist/polymer

  • Silicon
  • Poly Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Silicon Oxynitride
  • Photoresist
  • Blue film
  • Silicon
  • Silicon Oxide
  • Silicon Nitride
  • Glass
Restrictions Type IV and resist/polymer on polymer substrate

i.e. no resist coated wafers or crystalbonded chips!

Wafers with metal is not allowed Resist is not allowed


Pretreatment of various surfaces

General comment regarding III-V materials:

A dehydration bake prior to spin coating can be enough, especially if adhesion is not critical, and if the resist is not left more than a day or two on the surface. Application of dip/spin-on adhesion promoter can improve the adhesion and shelf life. If adhesion is critical in the subsequent process step, application of a thin layer of SiO2 using PECVD (followed by HMDS priming) as an adhesion layer is recommended.

Overview of what pretreatment is used for various surfaces at DTU Nanolab. Parentheses () indicate the method is not the optimal choice, or that the information is taken from product information supplied by manufacturers.

Dehydration BHF dip HMDS Dip/spin-on adhesion promoter Comment
Silicon with native oxide (X) X X (X)
Silicon oxide (X) X (X)
Silicon nitride (X) X (X)
Glass (borofloat/pyrex) X X (X) Dehydration before HMDS is probably best
Fused silica (quartz) X X (X) Dehydration before HMDS is probably best
InGaAs (X) SurPass 3000
GaAs (X) SurPass 3000
GaP (X) ? AR800-30 is being tested (leaves residue)
InP (X) ? AR800-30 is being tested (leaves residue)
GaN (X) ?
InN (X) ?


The information on III-V materials has been provided by Kresten Yvind at DTU Fotonik June 2021.

HMDS

The chemical treatment with hexamethyldisilazane (HMDS) before the spin coating can be used to promote the adhesion for photoresist. Vapor priming with HMDS leaves a mono-layer of TMS (trimethylsilyl) on the Si or SiO2 surface. The process dehydrates the substrate surface, and lowers the surface energy to promote better wetting.

The molecular formula for hexamethyldisilazane, or bis(trimethylsilyl)amine, is C6H19NSi2.

Schematic of the HMDS vapor priming process


Comparing HMDS priming

Equipment Oven: HMDS 2 Gamma UV/ Gamma e-beam and UV
Purpose
  • HMDS priming only
  • HMDS priming only
  • HMDS priming and spin coating
Priming chemical

hexamethyldisilazane (HMDS)

Performance Contact angle
  • Si (native oxide): 77.8°
  • SiO2 (110 nm): 81.7°
  • Boron Glass: 97.6°

Fast recipe [standard recipe]:

  • Si (native oxide): 72.9° [81.0°]
  • SiO2 (110 nm): 71.0° [79.7°]
  • Boron Glass: 90.7° [96.2°]
Process parameters Process temperature

150°C

120°C

Process time

25 minutes

1-2 min / wafer

Substrates Substrate size
  • Chips (using holder or silicon carrier)
  • 50 mm wafers
  • 100 mm wafers
  • 150 mm wafers
  • 50 mm wafers (tool change required)
  • 100 mm wafers
  • 150 mm wafers
  • 200 mm wafers (tool change required)
Allowed materials

Silicon, glass, and polymer substrates

III-V materials on silicon carrier

Film or pattern of all but types, except type IV and resist/polymer (incl. Crystalbond)

Silicon and glass wafers

Film or pattern of all but types, except type IV and resist/polymer (incl. Crystalbond)

Batch

1 - 25, multiple batches possible

1 - 25


Contact angle:
The contact angle of the substrate surface can be measured using the Drop Shape Analyzer.


Oven: HMDS 2

The Oven: HMDS 2 oven is located in E-5.

The user manual, user APV, and contact information can be found in LabManager:

Oven: HMDS 2 - requires login


Process information:

  • Recipe 1: baseline prime process with 5 min HMDS priming time


Spin Coater: Gamma UV

HMDS module (top) in Spin Coater: Gamma UV in E-5.

The user manual, user APV, and contact information can be found in LabManager:

Spincoater: Gamma UV - requires login


Additional information about the spin coater and processes can be found in Labadviser:

Spin Coater: Gamma UV


Spin Coater: Gamma e-beam & UV

Spin Coater: Gamma e-beam & UV in E-5.

The user manual, user APV, and contact information can be found in LabManager:

Spin Coater: Gamma e-beam & UV - requires login


Additional information about the spin coater and processes can be found in Labadviser:

Spin Coater: Gamma e-beam & UV


Buffered HF-Clean

BHF clean wetbench 04 in D-3.

Another commonly used method to render the surface of silicon wafers hydrophobic is the dilute HF dip.

BHF is mostly used to do pretreatment for new Si wafers.
The native oxide layer will be removed by 30 seconds of etching and this will promote the resist adhesion on the Si substrates. We recommend to spin coat resist as soon as possible after the procedure.


The user manual, user APV, and contact information can be found in LabManager:

Buffered HF-Clean in LabManager - requires login


Additional information about the spin coater and processes can be found in Labadviser:

Wet Silicon Oxide Etch (BHF)


Oven 250C

Oven 250C for pretreatment in Cx-1

The oven is typically used for dehydration pretreatment, of Si and glass substrates, to promote the resist adhesion. We recommend placing the wafers in a metal carrier in the oven for at least for 4 hours, or overnight, and spin coat resist on them as soon as possible after removing them from the oven.


The user manual, and contact information can be found in LabManager:

Oven 250C - requires login