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<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]]
{{cc-nanolab}}


= SEM =
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/Microscopy_314-307/SEM click here]'''


Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondar generated electrons are collected on a detector. Dependenging on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
[[Category:314]]
[[Category:314-Microscopy]]


= SEM =


We have four SEMs available at DTU Nanolab. Click on the instrument to find more information about the equipment and available techniques:
Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondary generated electrons are collected on a detector. Depending on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses.
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{| border="0" cellspacing="75" align="center"
We have five SEMs available at DTU Nanolab in building 314/307. Click on the instrument to find more information about the equipment and available techniques:
{| border="0" cellspacing="75" style="margin: auto;"
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| align="center" width="200px" heigth="250px" | '''Nova''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/SEM/Nova|Nova ]]
| align="center" width="200px" heigth="250px" | '''Nova''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy 314-307/SEM/Nova|Nova ]]
| align="center" width="200px" | '''QFEG''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/SEM/QFEG|QFEG ]]
| align="center" width="200px" | '''QFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/QFEG|QFEG ]]
| align="center" width="200px" | '''AFEG''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/SEM/AFEG|AFEG ]]
| align="center" width="200px" | '''AFEG''' [[image:Microscopy-icon_SEM.png|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/SEM/AFEG|AFEG ]]
| align="center" width="200px" | '''Helios''' [[image:Microscopy-icon.png|180px|frameless |link=LabAdviser/314/FIB/Helios|Helios ]]
|-
| align="center" width="200px" | '''Helios''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Helios|Helios ]]
| align="center" width="200px" | '''Hydra''' [[image:Microscopy-icon_FIB.jpg|180px|frameless |border |link=LabAdviser/314/Microscopy_314-307/FIB/Hydra|Hydra ]]
|}
|}


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{{SEM comparison table 314}}
{{SEM comparison table 314}}
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/LabAdviser/314/SEM click here]'''
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