Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions
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'''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G TAP300Al-G]''' for Tapping mode | '''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G TAP300Al-G]''' for Tapping mode | ||
|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or | |'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or | ||
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' | '''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' <br> | ||
or '''[https://www.brukerafmprobes.com/p-4050-pfdt350.aspx PFDT350 for ScanAsyst mode] | |||
PFDT350 | |||
|'''[https://www.brukerafmprobes.com/p-3693-snl-10.aspx SNL]''' | |'''[https://www.brukerafmprobes.com/p-3693-snl-10.aspx SNL]''' | ||
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=Evaluation of used probes= | =Evaluation of used probes= | ||
This evaluation was done to know if the tip end of the ScanAsyst probes was typically dirty or broken when we got bad images. If it was dirty, maybe we could find a way to clean it. If it was broken off we needed to replace it. It turned out it was in most cases broken. | |||
{| border="1" cellspacing="1" cellpadding="2" align="left" | {| border="1" cellspacing="1" cellpadding="2" align="left" | ||
! Box number and probe number | ! Box number and probe number | ||