Jump to content

Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/Workspaces: Difference between revisions

← Older edit
VisualWikitext
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,301 edits
Bghe (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators
7,301 edits
 
(35 intermediate revisions by the same user not shown)
Line 1: Line 1:
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/Workspaces click here]'''
'''Feedback to this page''': '''[mailto:labadviser@danchip.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.danchip.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/Workspaces click here]'''


=What scanning mode, experiment/workspace and probe should I select=
''This page is written by Berit Herstrøm @ DTU Nanolab ''
 
=What scanning mode, experiment/workspace and probe should be select=


{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;"  
{|border="1" cellspacing="1" cellpadding="3" style="text-align:left;"  
Line 13: Line 15:
!Steep/abrupt steps but no high aspect ratio
!Steep/abrupt steps but no high aspect ratio
!High aspect ratio measurements
!High aspect ratio measurements
!Large area fast scan
|-
|-


Line 18: Line 21:
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
!Recommended mode
!Recommended mode
|Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend '''ScanAsyst mode''' because of less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use.
|Roughness measurement can be done in both Contact, Tapping and ScanAsyst mode. We recommend '''Tapping mode''' or '''ScanAsyst mode.''' Tapping mode works fine for hard samples as silicon, metals and so on. ScanAsyst mode is recommended for soft samples, soft polymer, cells and the like because of less chance of (non-uniform) deformation of the sample and less tip wear. ScanAsyst is easier use but tapping mode is less sensitive to the tip wear.
|For Topographic measurements with no steep/abrupt steps we also recommend '''ScanAsyst mode''' due to less chance of (non-uniform) deformation of the sample and less tip wear - and because of ease of use.  
|For Topographic measurements with no steep/abrupt steps we also recommend '''Tapping mode''' on most samples. Only on very soft samples (e.g. cells) we recommend ''ScanAsyst'' due to less chance of (non-uniform) deformation of the sample - or if you need QNM data. We mainly recommend '''Tapping mode''' because we experience less problems when the tip end is slightly broken.  
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''ScanAsyst mode''' due to ease of use and lower tip wear.  
|For Steep/abrupt steps but no high aspect ratio structures we still recommend '''Tapping mode''' unless you need need QNM data.  
|For High aspect ratio measurements we recommend Tapping mode. There is not yet a ScanAsyst probe developed for high aspect ratio. Therefore we recommend '''Tapping mode'''.
|For High aspect ratio measurements we recommend Tapping mode. We do not have experience with ScanAsyst therefore we recommend '''Tapping mode'''. This requires special probes. You can buy this probes for both Tapping mode and ScanAsyst. They are at the moment (sep-2025) more expensive for ScanAsyst mode.
|For large scan areas where you prioritize to scan fast then you can use '''contact mode'''. Here you can scan with scan rate of up to 2.43 Hz
|-
|-


Line 27: Line 31:
|-style="background:LightGrey; color:black"
|-style="background:LightGrey; color:black"
!Recommended probes
!Recommended probes
|'''[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in air]'''
|'''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in air]'''
|'''[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in air]'''
|'''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in air]'''
|'''[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in air]''' for ScanAsyst mode
|'''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.brukerafmprobes.com/p-3726-scanasyst-air.aspx ScanAsyst in air]''' for ScanAsyst mode
'''[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G.html TAP300Al-G]''' for Tapping mode
'''[https://www.nanoandmore.com/AFM-Probe-Tap150Al-G Tap150Al-G]''' or '''[http://www.nanoandmore.com/AFM-Probe-Tap300Al-G TAP300Al-G]''' for Tapping mode
|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR.html AR5T-NCHR]'''
|'''[http://www.nanoandmore.com/AFM-Probe-AR5T-NCHR AR5T-NCHR]''' or
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]'''
'''[http://www.brukerafmprobes.com/p-3679-fib6-400a.aspx FIB6-400A]''' <br>
or '''[https://www.brukerafmprobes.com/p-4050-pfdt350.aspx PFDT350 for ScanAsyst mode]
|'''[https://www.brukerafmprobes.com/p-3693-snl-10.aspx SNL]'''
|-
|-


Line 39: Line 45:
!Recommended experiment/Workspace
!Recommended experiment/Workspace
|
|
'''QNM in air*'''
Check the user manual in LabManager
|
|
'''QNM in air*'''
Check the user manaual in LabManager
|'''QNM in air*'''
|Check the user manaual in LabManager
|'''TappingMode 300nm trench''' (for steps <~1µm)
|'''TappingMode 300nm trench''' (for steps <~1µm)
'''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm)
'''Tappping mode in air - 6µm Deep Trench''' (for steps >1~µm)
|'''Standard Contact mode'''
|-
|-


Line 55: Line 62:
==More information about de different modes==
==More information about de different modes==
===Contact, Tapping and Peak Force Tapping===
===Contact, Tapping and Peak Force Tapping===
Please flowing this link to Brukers homepage:
Please flowing this link to down load the file from LabManager (Requires login): <br>
[http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf Introduction_to_Brukers_ScanAsyst_and_PeakForce_Tapping_Atomic_Force_Microscopy_Technology_AFM_AN133.pdf]
[https://labmanager.dtu.dk/view_binary.php?fileId=5340 Introduction to Bruker ScanAsyst and PeakForce tapping AFM technology]


===PeakForce tapping and quantitative nanomechanical mapping===
===PeakForce tapping and quantitative nanomechanical mapping===
Please flowing this link to Brukers homepage:
*Application note on QNM: [https://labmanager.dtu.dk/view_binary.php?fileId=5404 requires login]
*[http://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/Publications/AL_Foster_April2012.pdf PeakForce tapping and Nanomechanical option]
*[https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/AN128-RevB0-Quantitative_Mechanical_Property_Mapping_at_the_Nanoscale_with_PeakForceQNM-AppNote.pdf Quantitative_Mechanical Property mapping at the Nanoscale with PeakForceQNM]


===Peak Force KPFM (Kelvin Probe Force Microscopy)===
===Peak Force KPFM (Kelvin Probe Force Microscopy)===
Please flowing this link to Brukers homepage:
*Application note on KPFM: [[File: PeakForce-Kelvin-Probe-Force-Microscopy-App-Note-BRUKER.pdf]] - used with permission
[https://www.bruker.com/fileadmin/user_upload/8-PDF-Docs/SurfaceAnalysis/AFM/ApplicationNotes/AN140-RevA1-PeakForce_KPFM-AppNote.pdf pf-kpfm.html]


=Evaluation of used probes=
=Evaluation of used probes=
This evaluation was done to know if the tip end of the ScanAsyst probes was typically dirty or broken when we got bad images. If it was dirty, maybe we could find a way to clean it. If it was broken off we needed to replace it. It turned out it was in most cases broken.
{| border="1" cellspacing="1" cellpadding="2"  align="left"
{| border="1" cellspacing="1" cellpadding="2"  align="left"
! Box number and probe number
! Box number and probe number
Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy/Workspaces"