LabAdviser/314/Microscopy 314-307/TEM/T20/STEM: Difference between revisions
Created page with "'''Scanning TEM:''' <br\> By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomi..." |
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'''Scanning TEM:''' <br | <span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]] | ||
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'''Scanning TEM:''' </br> | |||
By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image). | By using STEM and a high angle annular dark field detector (HAADF), it is possible to form images where the contrast is directly related to the atomic number (z-contrast image). | ||