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Created page with "==Optical Profiler (Filmetrics)== {{CC-bghe2}} <br> 275x275px|right|thumb|Optical Profiler (Filmetrics): positioned in the basement (346-904), {{photo1}} The Profilm3D optical profiler from Filmetrics uses white-light-interferometry (WLI) and phase-shifting-interferometry (PSI) to produce surface profiles and depth-of-field color images. The main purpose is 3D topographic imaging of surfaces, step height measurements and roughnes..."
 
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==Optical Profiler (Filmetrics)==
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Tencor_P17 click here]'''
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[[Category:Equipment|Characterization Profiler]]
[[Category:Characterization|Profiler]]
 
=Filmetrics (Optical Profiler)=
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[[image:Scanner without anotation.jpg|275x275px|right|thumb|Optical Profiler (Filmetrics): positioned in the basement (346-904), {{photo1}}]]
[[image:Scanner without anotation.jpg|275x275px|right|thumb|Optical Profiler (Filmetrics): positioned in the basement (346-904), {{photo1}}]]
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'''The user manual, technical information and contact information can be found in LabManager (requires login):'''
The user manual, technical information and contact information can be found in [http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=467 LabManager].
 
[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=467 Optical profiler (Filmetrics) info page in LabManager]






===Equipment performance and process related parameters===
===Performance and Process Parameters===


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!colspan="2" border="none" style="background:silver; color:black;" align="center"|<b>Equipment</b>
!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment
|style="background:WhiteSmoke; color:black"|<b>Optical profiler</b>
|style="background:WhiteSmoke; color:black"|<b>Optical profiler</b>
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Latest revision as of 20:48, 27 May 2025

The content on this page, including all images and pictures, was created by DTU Nanolab staff, unless otherwise stated.

Feedback to this page: click here

Filmetrics (Optical Profiler)

Unless otherwise stated, all content in this section was done by Berit Herstrøm, DTU Nanolab

Optical Profiler (Filmetrics): positioned in the basement (346-904), Photo: DTU Nanolab internal

The Profilm3D optical profiler from Filmetrics uses white-light-interferometry (WLI) and phase-shifting-interferometry (PSI) to produce surface profiles and depth-of-field color images.

The main purpose is 3D topographic imaging of surfaces, step height measurements and roughness measurements with larger FOV (Field Of View) than the AFM, but less horisontal resolution.

For most samples the optical profiler provides fast and easy information without any sample preparation. However, it can be necessary to cover thin transparent layers (< 2 µm) with a thin layer of metal.

The resolution is limited by the objective and the sampling resolution.


The user manual, technical information and contact information can be found in LabManager.


Performance and Process Parameters

Equipment Optical profiler
Purpose 3D topographic imaging of surfaces.
  • 3D imaging of surfaces
  • Roughness measurements
  • Step height measurements
  • 3D topographic measurements
Posibilities Interferometric profiling
  • Standard microscope imaging
  • PSI (Phase Shift Interferometry)
  • WLI (White light Interferometry)
  • Stitched scans
  • Wafer mapping
Performance With the current 10x objective

See here the data sheet for this instrument (requires login)]

Substrates Substrate size
  • Substrates no bigger than 100 mm x 100mm
Substrate materials allowed
  • In principle all materials