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[[Category: Equipment|Lithography]]
[[Category: Lithography]]
 
__TOC__


=General Process Information=
=General Process Information=
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*Spin coating
*Spin coating
*Soft baking
*Soft baking
'''Features of Spin Coater: Gamma UV'''
'''Features of Spin Coater: Gamma UV'''
*Cassette-to-cassette wafer handling
*Cassette-to-cassette wafer handling
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*Purging
*Purging
*Cooling
*Cooling
The top and bottom heaters of the VPO module are typically set to 120°C. The wafer is baked under a low vacuum (~0.35 bar) in order to heat and dehydrate the wafer before HMDS application. The HMDS is injected into the process chamber using nitrogen as a carrier gas. 10 liters per minute of dry nitrogen is bubbled through liquid HMDS before flowing into the chamber. The injection lasts until ambient pressuer is reached in the chamber. After the reaction time, the chamber is purged using nitrogen. Finally, the wafer is cooled on the cool plate.
The top and bottom heaters of the VPO module are typically set to 120°C. The wafer is baked under a low vacuum (~0.35 bar) in order to heat and dehydrate the wafer before HMDS application. The HMDS is injected into the process chamber using nitrogen as a carrier gas. 10 liters per minute of dry nitrogen is bubbled through liquid HMDS before flowing into the chamber. The injection lasts until ambient pressuer is reached in the chamber. After the reaction time, the chamber is purged using nitrogen. Finally, the wafer is cooled on the cool plate.


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*Spin-off
*Spin-off
*Backside rinse using PGMEA
*Backside rinse using PGMEA


The wafer is first centered on the spindle chuck and held in place by vacuum. If static dispense is specified in the process, the spindle remains static during the ensuing resist dispense. In the case of dynamic dispense, the spindle is accelerated to a low spin speed before the resist is dispensed. Using too high spin speed during dispense can cause surface wetting issues, while a too low spin speed causes the resist to flow onto the backside of the wafer. The resist is dispensed through the dispense arm, positioned over the center of the wafer. The resist pump administers a volume of resist which depends on the substrate size.
The wafer is first centered on the spindle chuck and held in place by vacuum. If static dispense is specified in the process, the spindle remains static during the ensuing resist dispense. In the case of dynamic dispense, the spindle is accelerated to a low spin speed before the resist is dispensed. Using too high spin speed during dispense can cause surface wetting issues, while a too low spin speed causes the resist to flow onto the backside of the wafer. The resist is dispensed through the dispense arm, positioned over the center of the wafer. The resist pump administers a volume of resist which depends on the substrate size.


The spin-off cycle determines the thickness of the resist coating. The thickness is primarily a function of the spin-off speed and the spin-off time, both following an inverse power-law (y=k*x^-a). The acceleration to the spin-off speed also influences the thickness, but the effect is dependent on previous steps. The spin-off is usually a simple spin at one speed, but it may be comprised of several steps at different spin speeds. After spin-off, the wafer is decelerated.
The spin-off cycle determines the thickness of the resist coating. The thickness is primarily a function of the spin-off speed and the spin-off time, both following an inverse power-law. The acceleration to the spin-off speed also influences the thickness, but the effect is dependent on previous steps. The spin-off is usually a simple spin at one speed, but it may be comprised of several steps at different spin speeds. After spin-off, the wafer is decelerated.


Dependent on the spin speeds used in the various steps of the spin coating, resist may creep over the edge of the wafer and onto the backside. Also, some resists tend to leave fine strings of resist protruding from the edge of the wafer, or folded onto the backside, an effect sometimes referred to as "cotton candy". This resist will contaminate the soft bake hotplate, and thus subsequent wafers with resist. In a backside rinse step, solvent administered through a nozzle to the backside of the wafer while spinning dissolves the resist and washes it away. After the rinse, a short spin dries the wafer before the soft bake. Backside rinse may be done as part of the spin-off step(s). During the backside rinse solvent inevitably creeps onto the front side of the wafer, and may remove the resist coating on the edge of the wafer. As an alternative to backside rinse, a wafer which is left dirty on the backside by the spin coat process may be soft baked in proximity in order to protect the hotplate from contamination. This leaves front side coating intact, but also leaves the backside dirty.
Dependent on the spin speeds used in the various steps of the spin coating, resist may creep over the edge of the wafer and onto the backside. Also, some resists tend to leave fine strings of resist protruding from the edge of the wafer, or folded onto the backside, an effect sometimes referred to as "cotton candy". This resist will contaminate the soft bake hotplate, and thus subsequent wafers with resist. In a backside rinse step, solvent administered through a nozzle to the backside of the wafer while spinning dissolves the resist and washes it away. After the rinse, a short spin dries the wafer before the soft bake. Backside rinse may be done as part of the spin-off step(s). During the backside rinse solvent inevitably creeps onto the front side of the wafer, and may remove the resist coating on the edge of the wafer. As an alternative to backside rinse, a wafer which is left dirty on the backside by the spin coat process may be soft baked in proximity in order to protect the hotplate from contamination. This leaves front side coating intact, but also leaves the backside dirty.
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==Soft baking==
==Soft baking==
After spin coating, the solvent in the resist formulation must be evaporated in a baking step in order to solidify the resist. This soft bake can be carried out as a contact bake or a proximity bake. In a contact bake, the wafer is held in close contact to the hotplate surface while resting on shallow bumps only 150µm above the hotplate. In a proximity bake, the wafer is first moved into proximity, e.g. 1mm, of the hotplate surface, then held there (on the lift pins) for the duration of the bake. The hotplate temperatures of the baking modules of Spin Coater: Gamma UV are set at temperatures relevant to the resist used, typically 90-110°C. After baking, the wafer is cooled for 20 seconds on the cool plate.
After spin coating, the solvent in the resist formulation must be evaporated in a baking step in order to solidify the resist. This soft bake can be carried out as a contact bake or a proximity bake. In a contact bake, the wafer is held in close contact to the hotplate surface while resting on shallow bumps only 150µm above the hotplate. In a proximity bake, the wafer is first moved into proximity, e.g. 1mm, of the hotplate surface, then held there (on the lift pins) for the duration of the bake. The hotplate temperatures of the baking modules of Spin Coater: Gamma UV are set at temperatures relevant to the resist used, typically 90-110°C. After baking, the wafer is cooled for 20 seconds on the cool plate.
=Quality Control (QC)=
{| border="1" cellspacing="2" cellpadding="2" colspan="3"
|bgcolor="#98FB98" |'''Quality Control (QC) for Spin Coater: Gamma UV - AZ nLOF 2020'''
|-
|
*[http://labmanager.dtu.dk/d4Show.php?id=5123&mach=359 The QC procedure for Spin Coater: Gamma UV] - '''requires login'''<br>
*[http://labmanager.dtu.dk/view_binary.php?fileId=4211 The newest QC data for Spin Coater: Gamma UV] - '''requires login'''
{| {{table}}
| align="center" |
{| border="1" cellspacing="1" cellpadding="2"  align="center" style="width:400px"
! QC Recipe:
! (2421) DCH 100mm nLOF 2020 2um HMDS
|-
|Substrate size
|4"
|-
| Resist volume
|3 ml
|-
|Spin-off speed
|3300 rpm
|-
|Spin-off time
|30 s
|-
|Soft bake temperature
|110°C, contact
|-
|Soft bake time
|60 s
|-
|}
| align="center" valign="top"|
{| border="2" cellspacing="1" cellpadding="2" align="center" style="width:400px"
!QC limits
!Spin Coater: Gamma UV - AZ nLOF 2020
|-
|Nominal film thickness
|2.0 µm
|-
|Film thickness deviation from nominal
|<5%
|-
|Film thickness non-uniformity
|<5%
|-
|}
|-
|}
Spin-off speed will be adjusted if film thickness is outside the limit.
|}
{| border="1" cellspacing="2" cellpadding="2" colspan="3"
|bgcolor="#98FB98" |'''Quality Control (QC) for Spin Coater: Gamma UV - AZ 5214E'''
|-
|
*[http://labmanager.dtu.dk/d4Show.php?id=5123&mach=359 The QC procedure for Spin Coater: Gamma UV] - '''requires login'''<br>
*[http://labmanager.dtu.dk/view_binary.php?fileId=4211 The newest QC data for Spin Coater: Gamma UV] - '''requires login'''
{| {{table}}
| align="center" |
{| border="1" cellspacing="1" cellpadding="2"  align="center" style="width:400px"
! QC Recipe:
! (3411) DCH 100mm 5214E 1.5um HMDS
|-
|Substrate size
|4"
|-
| Resist volume
|3 ml
|-
|Spin-off speed
|4500 rpm
|-
|Spin-off time
|30 s
|-
|Soft bake temperature
|90°C, contact
|-
|Soft bake time
|60 s
|-
|}
| align="center" valign="top"|
{| border="2" cellspacing="1" cellpadding="2" align="center" style="width:400px"
!QC limits
!Spin Coater: Gamma UV - AZ 5214E
|-
|Nominal film thickness
|1.5 µm
|-
|Film thickness deviation from nominal
|<5%
|-
|Film thickness non-uniformity
|<5%
|-
|}
|-
|}
Spin-off speed will be adjusted if film thickness is outside the limit.
|}


=Standard Processes=
=Standard Processes=
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Test results:
Test results:
{|border="1" cellspacing="0" cellpadding="3" style="text-align:left;"  
{|border="1" cellspacing="1" cellpadding="10" style="text-align:left;"
|-
|-


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|
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|
|taran
|
|average of nine measurements (three measurements on three different samples)
|average of nine measurements (three measurements on three different samples)


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|
|taran
|
|average of three measurements on one sample
|average of three measurements on one sample


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Test results:
Test results:
{|border="1" cellspacing="0" cellpadding="3" style="text-align:left;"  
{|border="1" cellspacing="1" cellpadding="10" style="text-align:left;"  
|-
|-


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|
|
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|taran
|
|average of nine measurements (three measurements on three different samples)
|average of nine measurements (three measurements on three different samples)


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|
|
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|
|taran
|
|average of three measurements on one sample
|average of three measurements on one sample


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|taran
|taran
|4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm
|4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm
|-
|-style="background:WhiteSmoke; color:black"
|Silicon with native oxide
|4.24 µm
|0.5%
|7/1 2025
|taran
|Old sequence (proximity bake and only 60s by mistake).
4" wafer, with HMDS. 9 points on one wafer, exclusion zone 5mm
|-
|-style="background:WhiteSmoke; color:black"
|Silicon with native oxide
|3.99 µm
|0.3%
|7/1 2025
|taran
|New sequence with contact bake.
4" wafer, with HMDS. 9 points on one wafer, exclusion zone 5mm
|}
|}


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*'''(2420) DCH 100mm nLOF 2020 2um'''
*'''(2420) DCH 100mm nLOF 2020 2um'''
*'''(2421) DCH 100mm nLOF 2020 2um HMDS'''
*'''(2421) DCH 100mm nLOF 2020 2um HMDS''' see also [[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_UV_processing#Quality_Control_.28QC.29|'''QC''']]
*'''(2620) DCH 150mm nLOF 2020 2um'''
*'''(2620) DCH 150mm nLOF 2020 2um'''
*'''(2621) DCH 150mm nLOF 2020 2um HMDS'''
*'''(2621) DCH 150mm nLOF 2020 2um HMDS'''
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''Sequence names, process parameters, and test results (Sequence no. 3000-3999):''
''Sequence names, process parameters, and test results (Sequence no. 3000-3999):''
*'''(3410) DCH 100mm 5214E 1.5um'''
*'''(3410) DCH 100mm 5214E 1.5um'''
*'''(3411) DCH 100mm 5214E 1.5um HMDS'''
*'''(3411) DCH 100mm 5214E 1.5um HMDS''' see also [[Specific_Process_Knowledge/Lithography/Coaters/Spin_Coater:_Gamma_UV_processing#Quality_Control_.28QC.29|'''QC''']]
*'''(3610) DCH 150mm 5214E 1.5um'''
*'''(3610) DCH 150mm 5214E 1.5um'''
*'''(3611) DCH 150mm 5214E 1.5um HMDS'''
*'''(3611) DCH 150mm 5214E 1.5um HMDS'''
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=Syringe processes=
=Syringe processes=
Use of the syringe requires special training, and would as a starting point require batches in excess of 20 wafers.


==AZ 4562 coating (syringe)==
==AZ 4562 coating (syringe)==
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|19/3 2015
|19/3 2015
|taran
|taran
|SAT results. 4" wafer, no HMDS. 5 wafers measured: thickness is average of all 5; uniformity is worst case. 9 points on each wafer, exclusion zone 5mm.
|SAT results. 4" wafer. 5 wafers measured: thickness is average of all 5; uniformity is worst case. 9 points on each wafer, exclusion zone 5mm.
|-
|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
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|19/3 2015
|19/3 2015
|taran
|taran
|SAT results. 6" wafer, no HMDS. 3 wafers measured: thickness is average of all 3; uniformity is worst case. 13 points on each wafer, exclusion zone 5mm.
|SAT results. 6" wafer. 3 wafers measured: thickness is average of all 3; uniformity is worst case. 13 points on each wafer, exclusion zone 5mm.
|}
|}


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|20/3 2015
|20/3 2015
|taran
|taran
|4" wafer, no HMDS. 9 points on one wafer, exclusion zone 5mm.
|4" wafer. 9 points on one wafer, exclusion zone 5mm.
|}
|}


==AZ "5206E" coating (syringe)==
==AZ "5206E" coating (syringe)==
!SECTION UNDER CONSTRUCTION!


Spin coating of AZ 5206E (AZ 5214E 1:1 by volume in PGMEA) dispensed from syringe on Spin Coater: Gamma UV is divided into three steps: HMDS priming, spin coating, and soft baking. The HMDS priming is equal to the ''HMDS fast'' process. The spin coating uses dynamic dispense of resist at 800? rpm, using a volume of 1.5 ml for 100 mm substrates. The dispense is followed by spin-off at a thickness dependent spin speed for 30 seconds. The thickness range is approximately 0.4-0.6µm. Soft baking is done at 90°C for 60s.
Spin coating of AZ 5206E (AZ 5214E 1:1 by volume in PGMEA) dispensed from syringe on Spin Coater: Gamma UV is divided into three steps: HMDS priming, spin coating, and soft baking. The HMDS priming is equal to the ''HMDS fast'' process. The spin coating uses dynamic dispense of resist at 800? rpm, using a volume of 1.5 ml for 100 mm substrates. The dispense is followed by spin-off at a thickness dependent spin speed for 30 seconds. The thickness range is approximately 0.4-0.6µm. Soft baking is done at 90°C for 60s.
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!Thickness
!Thickness
!Uniformity (+/-)
!Uniformity (+/-)
!Spin-off speed
!Test date
!Test date
!Tester initials
!Tester initials
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|0.49 µm
|0.49 µm
|0.9%
|0.9%
|2200 rpm
|23/4 2018?
|23/4 2018?
|taran
|taran
|4" wafer, no HMDS, 2200 rpm. 9 points measured, exclusion zone 5mm.
|4" wafer, no HMDS. 9 points measured, exclusion zone 5mm.
|-
|-
|-style="background:WhiteSmoke; color:black"
|-style="background:WhiteSmoke; color:black"
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|0.54
|0.54
|0.4%
|0.4%
|2200? rpm
|30/1 2019
|30/1 2019
|taran
|taran
|4" wafer, with HMDS, 2200? rpm. 9 points measured, exclusion zone 5mm.
|4" wafer, with HMDS. 9 points measured, exclusion zone 5mm.
|}
|}