Specific Process Knowledge/Characterization/XRD/XRD Powder/Measurement tips: Difference between revisions

Latest revision as of 16:24, 13 May 2024

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Choosing measurement parameters

Some helpful tips can now be found in the manual on LabManager, section 4. They are mostly copied from the XRDMP Creater help document, which we for copyright reasons do not make available here.

A detailed manual on the Aeris XRD is found online on the wiki of the International Ocean Discovery Project. It has helpful hints on adjusting the hardware including choices on beam knife height and slit size, more focused on geological samples but otherwise similar to what we write in the Nanolab manual for the XRD Powder.

Fluorescence suppression

It is possible to adjust the Pulse Height Discrimination levels of the Pixcel 1D detector on our machine. This can help suppress signal from fluorescence, which is at a slightly different energy level than the pure copper K-alpha signal. The exact energy level of the fluorescence of course depends on the material you are measuring.

Here is a comparison of a measurement of FeOH with and without fluorescence suppression (green with fluorescence suppression, blue without, rather noisy / quick measurement done here but you see the difference in background intensity very clearly):

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+==Choosing measurement parameters==
-<code><nowiki>=<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Under_construction.png|200px]]=</nowiki></code>
+Some helpful tips can now be found in the [https://labmanager.dtu.dk/d4Show.php?id=6584&mach=463#dafs72253 manual on LabManager], section 4. They are mostly copied from the XRDMP Creater help document, which we for copyright reasons do not make available here.
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+A detailed manual on the Aeris XRD is found online on the [https://wiki.iodp.tamu.edu/display/LMUG/Aeris+Advanced+User+Guide wiki of the International Ocean Discovery Project]. It has helpful hints on adjusting the hardware including choices on beam knife height and slit size, more focused on geological samples but otherwise similar to what we write in the Nanolab manual for the XRD Powder.
-=<span style="background:#FF2800">THIS PAGE IS UNDER CONSTRUCTION</span>[[image:Bge-Under construction.jpg|200px]]=
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-==Choosing measurement parameters==
+==Fluorescence suppression==
-A detailed manual on the Aeris XRD is found on the [https://wiki.iodp.tamu.edu/display/LMUG/Aeris+Advanced+User+Guide wiki of the International Ocean Discovery Project]. It has helpful hints on adjusting the hardware including choices on beam knife height and slit size. It also has some pictures from the XRDMP Creator software. Some info from there:
+It is possible to adjust the Pulse Height Discrimination levels of the Pixcel 1D detector on our machine. This can help suppress signal from fluorescence, which is at a slightly different energy level than the pure copper K-alpha signal. The exact energy level of the fluorescence of course depends on the material you are measuring.
+Here is a comparison of a measurement of FeOH with and without fluorescence suppression (green with fluorescence suppression, blue without, rather noisy / quick measurement done here but you see the difference in background intensity very clearly):
-...Scanning at angles less than 5° 2θ you will need to lower the knife (anti scatter).
+[[File:fluoresc supp feoh.png|400px|caption:FeOH measured with and without fluorescence suppression.]]
-.... at low angles you also need a narrower slit (which will reduce intensity but also the irradiated area)