Specific Process Knowledge/Thin film deposition/Deposition of Aluminium: Difference between revisions
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'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Aluminium click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Aluminium click here]''' | ||
<i> Unless otherwise stated, this page is written by <b>DTU Nanolab internal</b></i> | |||
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==Sputtering of Aluminium== | ==Sputtering of Aluminium== | ||
Aluminium may be sputter deposited in either the Wordentec, the | Aluminium may be sputter deposited in either the Wordentec, the sputter-system (Lesker), or the cluster-based sputter system ("Sputter-System Metal-Oxide(PC1)" and "Sputter-System Metal-Nitride(PC3)"). See more in the matrix below. | ||
*[[/Sputter rates for Al|Sputtering of Aluminium in the Wordentec]] | *[[/Sputter rates for Al|Sputtering of Aluminium in the Wordentec]] | ||
*[[/Al sputtering in Sputter System (Lesker) |Al sputtering in Sputter System (Lesker)]] | |||
*[[/Al_Sputtering_in_Cluster_Lesker_PC3 |Al Sputtering in Sputter-System Metal-Nitride(PC3)]] | |||
==E-beam evaporation of Aluminium== | ==E-beam evaporation of Aluminium== | ||
Aluminium can be deposited by e-beam assisted evaporation in the Wordentec | Aluminium can be deposited by e-beam assisted evaporation in the Wordentec and the two Temescal tools. | ||
*[[/Al Ebeam evaporation in Temescal |E-beam evaporation of Al in Temescal]] | |||
*[[/Notes on low oxygen content in e-beam prepared Al thin films|Notes on low oxygen content in e-beam prepared Al thin films (Temescal)]] | |||
<!----> | <!----> | ||
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*[[/Thermal deposition of Al|Thermal deposition of Aluminium]] | *[[/Thermal deposition of Al|Thermal deposition of Aluminium]] | ||
==Comparison of Al deposition options== | |||
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! | ! | ||
! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Temescal| | ! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Temescal|E-beam evaporator (Temescal)]] and [[Specific Process Knowledge/Thin film deposition/10-pocket e-beam evaporator|E-beam evaporator (10-pockets)]]) | ||
! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Lesker|Sputter-System (Lesker)]]) | |||
! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | |||
! Thermal evaporation ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! Thermal evaporation ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
! Thermal evaporation ([[Specific Process Knowledge/Thin film deposition/thermalevaporator|Thermal Evaporator]]) | ! Thermal evaporation ([[Specific Process Knowledge/Thin film deposition/thermalevaporator|Thermal Evaporator]]) | ||
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E-beam deposition of Aluminium | E-beam deposition of Aluminium | ||
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Sputter deposition of Aluminium | |||
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Sputter deposition of Aluminium | |||
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Sputter deposition of Aluminium | Sputter deposition of Aluminium | ||
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|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Pre-clean | ! Pre-clean | ||
|Ar ion etch | |Ar ion etch (only in E-beam evaporator Temescal) | ||
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|RF Ar clean | |RF Ar clean | ||
|RF Ar clean | |RF Ar clean | ||
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|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Layer thickness | ! Layer thickness | ||
|10Å to 1 µm* | |10Å to 1 µm* | ||
|10Å to 1 µm* | |10Å to 1 µm* | ||
|10Å to ~0.5µm | |||
|10Å to ~0.5µm (very time consuming ) | |10Å to ~0.5µm (very time consuming ) | ||
|10Å to 0. | |10Å to ~0.5µm | ||
|10Å to 1 µm | |10Å to 0.12 µm | ||
|10Å to 1 µm* | |||
|- | |- | ||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
! Deposition rate | ! Deposition rate | ||
| | |1Å/s to 10Å/s | ||
| | |1Å/s to 15Å/s | ||
|Depending on [[/Sputter rates for Al|process parameters]], up to ~2.5 Å/s | |Depending on [[/Sputter rates for Al|process parameters]], up to ~2.5 Å/s | ||
|~1. | |Depending on [[/Al sputtering in Sputter System (Lesker) |process parameters]] at least up to 0.7 Å/s | ||
|Depending on process parameters at least up to 1.3 Å/s. See conditions [[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Standard_recipe_performance|here]] | |||
|~1.5 Å/s to 2 Å/s | |||
|0.5, 1, or 2 Å/s | |0.5, 1, or 2 Å/s | ||
|- | |- | ||
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*Up to 4x6" or 3x8" wafers | *Up to 4x6" or 3x8" wafers | ||
*smaller pieces | *smaller pieces | ||
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*6x4" wafers or | *6x4" wafers or | ||
*6x6" wafers | *6x6" wafers | ||
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*1x4" wafer or | |||
*1x6" wafer or | |||
several small samples | |||
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*up to 10x4" wafers or | |||
*up to 10x6" wafers | |||
*or many smaller samples | |||
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*24x2" wafers or | *24x2" wafers or | ||
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*6x6" wafers | *6x6" wafers | ||
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*Up to one 8" wafer (limited uniformity on large substrates) | *Up to 3 x 4" wafers or one 6" or 8" wafer (limited uniformity on large substrates) | ||
*Many small chips | |||
|-style="background:LightGrey; color:black" | |-style="background:LightGrey; color:black" | ||
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Approx. 20 min | Approx. 20 min | ||
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Approx. 1.5 hour | |||
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Approx. 1.5 hour | |||
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Approx. 10 min | Approx. 10 min | ||
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Approx. | Approx. 5 min plus 6 min transfer time | ||
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Approx. 1 hour | Approx. 1.5 hour | ||
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Approx. 15 min | Approx. 15 min | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Allowed | ! Allowed materials | ||
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Almost any that does not degas. See the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=511 cross-contamination sheet]. | |||
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Almost any that does not degas. See the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=167 cross-contamination sheet]. | |||
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Almost any that does not degas. See the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=167 cross-contamination sheet]. | |||
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* Silicon wafers | * Silicon wafers | ||
* | * and almost any | ||
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* | *Almost that does not degas - see cross contamination sheets for [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=441 PC1] and [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=442 PC3] | ||
* Special carrier for III-V materials. | |||
* | |||
| | | | ||
Almost any that does not degas. See the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=167 cross-contamination sheet]. | |||
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Almost any that does not degas. See the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=404 cross-contamination sheet]. | |||
|-style="background:LightGrey; color:black" | |||
|-style="background: | |||
! Comment | ! Comment | ||
|'''*''' Thickness above 600 nm: ask for permission | |'''*''' Thickness above 600 nm: ask for permission | ||
It is possible to tilt the substrate. | It is possible to tilt the substrate. | ||
|'''*''' Thickness above 600 nm: ask for permission. | |'''*''' Thickness above 600 nm: ask for permission. | ||
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|'''**'''Thickness above | | | ||
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|'''**'''Thickness above 120 nm: ask for permission | |||
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''' | '''*''' ''For cumulative deposition above 600 nm please write to metal@nanolab.dtu.dk to make sure there will be enough Al for your deposition'' | ||
==Aluminium deposition on ZEP520A for lift-off - comparison of thermal and e-beam evaporation == | ==Aluminium deposition on ZEP520A for lift-off - comparison of thermal and e-beam evaporation == |
Latest revision as of 14:42, 19 January 2024
Feedback to this page: click here
Unless otherwise stated, this page is written by DTU Nanolab internal
Deposition of Aluminium
Aluminium can be deposited by e-beam evaporation, by sputtering and by thermal evaporation. In the chart below you can compare the different methods on the different deposition equipment.
Sputtering of Aluminium
Aluminium may be sputter deposited in either the Wordentec, the sputter-system (Lesker), or the cluster-based sputter system ("Sputter-System Metal-Oxide(PC1)" and "Sputter-System Metal-Nitride(PC3)"). See more in the matrix below.
E-beam evaporation of Aluminium
Aluminium can be deposited by e-beam assisted evaporation in the Wordentec and the two Temescal tools.
Thermal deposition of Aluminium
In the Wordentec and the Thermal evaporator aluminium can be deposited by thermal deposition. The two instruments are compared on the following page:
Comparison of Al deposition options
E-beam evaporation (E-beam evaporator (Temescal) and E-beam evaporator (10-pockets)) | E-beam evaporation (Wordentec) | Sputter deposition (Wordentec) | Sputter deposition (Sputter-System (Lesker)) | Sputter deposition (Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) | Thermal evaporation (Wordentec) | Thermal evaporation (Thermal Evaporator) | |
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General description |
E-beam deposition of Aluminium |
E-beam deposition of Aluminium |
Sputter deposition of Aluminium |
Sputter deposition of Aluminium |
Sputter deposition of Aluminium |
Aluminum deposition onto unexposed e-beam resist |
Aluminum deposition onto unexposed e-beam resist |
Pre-clean | Ar ion etch (only in E-beam evaporator Temescal) | RF Ar clean | RF Ar clean | ||||
Layer thickness | 10Å to 1 µm* | 10Å to 1 µm* | 10Å to ~0.5µm | 10Å to ~0.5µm (very time consuming ) | 10Å to ~0.5µm | 10Å to 0.12 µm | 10Å to 1 µm* |
Deposition rate | 1Å/s to 10Å/s | 1Å/s to 15Å/s | Depending on process parameters, up to ~2.5 Å/s | Depending on process parameters at least up to 0.7 Å/s | Depending on process parameters at least up to 1.3 Å/s. See conditions here | ~1.5 Å/s to 2 Å/s | 0.5, 1, or 2 Å/s |
Batch size |
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several small samples |
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Pumping time from wafer load |
Approx. 20 min |
Approx. 1.5 hour |
Approx. 1.5 hour |
Approx. 10 min |
Approx. 5 min plus 6 min transfer time |
Approx. 1.5 hour |
Approx. 15 min |
Allowed materials |
Almost any that does not degas. See the cross-contamination sheet. |
Almost any that does not degas. See the cross-contamination sheet. |
Almost any that does not degas. See the cross-contamination sheet. |
|
Almost any that does not degas. See the cross-contamination sheet. |
Almost any that does not degas. See the cross-contamination sheet. | |
Comment | * Thickness above 600 nm: ask for permission
It is possible to tilt the substrate. |
* Thickness above 600 nm: ask for permission.
|
**Thickness above 120 nm: ask for permission
|
* For cumulative deposition above 600 nm please write to metal@nanolab.dtu.dk to make sure there will be enough Al for your deposition
Aluminium deposition on ZEP520A for lift-off - comparison of thermal and e-beam evaporation
This is a small study of which aluminium deposition that is best for aluminium lift-off on ZEP520A resist and a very thin layer of aluminium (~20nm). The grain size is compared for the different methods.
The conclusion was that e-beam evaporation of aluminium at 15 Å/s gave the best result.
See details of the study here.
Aluminium deposition on AZ5214 for lift-off
Negative photolithography process is recomended.
Positive photolithography process from 1,5 µm is possible especially for thin layers of metal.
The more pattern the easyer lift.
It was tried (jan09) to lift 2.5 µm Al on 4.2µ negative resist on top of 11 µm Apox SiO2 in an acetone sonic-bath. The Al deposition process was done in steps evaporating 500 nm a time with 5 min pause and pressure down to at least 2E-6.
Roughness of thermally evaporated aluminium
A study by AFM was performed to examine Al films deposited with thermal evaporation in the Wordentec. See details here.