Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/Nitride Etch: Difference between revisions
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[[Category: Equipment |Etch DRIE]] | |||
[[Category: Etch (Dry) Equipment|DRIE]] | |||
<br> {{CC-bghe1}} | |||
==Etching of silicon rich nitride (SRN) with recipes developed for SiO2 etching== | ==Etching of silicon rich nitride (SRN) with recipes developed for SiO2 etching== | ||
{{CC-bghe2}}<br> | |||
{| border="2" cellspacing="2" cellpadding="3" | |||
!Parameter | |||
|Recipe name: '''SiO2_res_10''' | |||
|Recipe name: '''DOE2/Post_II_21''' | |||
|- | |||
|Coil Power [W] | |||
|2500 | |||
|3840 | |||
|- | |||
|Platen Power [W] | |||
|300 | |||
|300 | |||
|- | |||
|Platen temperature [<sup>o</sup>C] | |||
|20 | |||
|20 | |||
|- | |||
|H2 flow [sccm] | |||
|25.6 | |||
|0 | |||
|- | |||
|He flow [sccm] | |||
|448.7 | |||
|0 | |||
|- | |||
|C<sub>4</sub>F<sub>8</sub> flow [sccm] | |||
|25.6 | |||
|30 | |||
|- | |||
|Pressure [mTorr] | |||
|8.8 | |||
|0.9 | |||
|- | |||
|} | |||
{| border="2" cellspacing="2" cellpadding="3" | |||
!Measured results | |||
!'''SiO2_res_10''' | |||
!'''DOE2/Post_II_21''' | |||
|- | |||
|Average etch of SRN on 6" wafer | |||
|166 nm/min [+- 17% over a 6" wafer]''' | |||
|142 nm/min [+- 9% over a 6" wafer]''' | |||
|- | |||
|Etch rate of Si3N4 | |||
|? | |||
|? | |||
|- | |||
|Etch rate of SiO2 | |||
|250 nm/min [+- 3% over a 6" wafer] | |||
|306 nm/min [on small piece] | |||
|- | |||
|Etch rate in Si | |||
|?nm/min | |||
|? nm/min | |||
|- | |||
|Etch rate of Mir resist | |||
|'''? nm/min | |||
|'''? nm/min | |||
|- | |||
|} | |||
===Etch rate uniformity=== | |||
<gallery caption="SRN (LPCVD) etch uniformity with recipes optimized for SiO2 etching tested on unpatterned wafers" widths="400px" heights="250px" perrow="2"> | |||
File:SRN etch uniformity SiO2_res_10.jpg | |||
File:SRN etch uniformity DOE2_Post_II_21.jpg | |||
</gallery> | |||
====Adding electromagnets (EM) to see if that could improve the uniformity==== | |||
Recipe used: SiO2_res_10<br> | |||
[[File:Contour Plot SNR_a06 EM_02_30 white to blue.jpg|400px|left|thumb|SRN etch with SiO2_res and EM:02/30. The electromagnets did not change much. Average etch rate: 166.5 nm/min +-12% ]] | |||
[[File:Contour Plot SNR_a12 etch rate.jpg|400px|left|thumb|SRN etch with SiO2_res and EM:10/0. The outer coil just seems to make it worse. Average etch rate: 114 nm/min +-60% ]] | |||