View source for Specific Process Knowledge/Characterization/XRD/XRD Powder

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=The XRD Powder setup=
[[Image:machine front with on-off button.JPG|right|thumb|300px|The XRD Powder located in the basement of building 346 at Nanolab, Room 904.]]
The "XRD powder" is an Aeris Research edition benchtop X-ray diffractometer from Malvern Panalytical. It is meant for phase analysis of powders, is easy to use, and offers the option of making measurements while heating the sample in a N<sub><sub>2</sub></sub> atmosphere. The setup allows X-ray diffraction measurements with a Cu source in Bragg-Brentano mode (i.e., Theta-2Theta measurements where the incident and diffraction arms of the goniometer are coupled). We have a very limited selection of optics for this instrument, so there is little that the user can adjust.
The instrument has a 1D strip detector, which makes data acquisition very efficient, so you can measure your samples relatively quickly. The detector also has a fluorescence suppression option, so you can measure samples containing  for instance iron with the copper radiation.

Please contact the equipment responsible if you would like to mount the special sample holder for heating during the measurement. 

'''The user manual(s), user APV(s), technical information, and contact information can be found in LabManager:''' 

[http://labmanager.dtu.dk/function.php?module=Machine&view=view&mach=463 XRD Powder in LabManager]  - requires login


==Process information==

*Tips for choosing among the scan and hardware parameters including fluorescence suppression: [[/Measurement tips| XRD Powder measurement tips]]

*Malvern Panalytical has a large collection of webinars on XRD. You have to register to view them but the amount of email you receive afterwards is modest, so it's worth it in my opinion (Rebecca, July 2022). Some useful webinars include:
**[https://www.malvernpanalytical.com/en/learn/events-and-training/webinars/W20200604XRD.html Better XRD data quality with good sample preparation]
**A [https://www.malvernpanalytical.com/en/learn/events-and-training/webinars/W20210330XRD.html beginner’s tutorial] which also mentions sample preparation about half-way through and explains very briefly some of the issues that can arise from displaced samples, not having a thick enough sample layer, odd sized sample particles, etc.
 
===Software===
To adjust measurement parameters and analyze the data, you will need dedicated software which is described here: [[/XRD Powder software| XRD Powder software]]

==Equipment performance and process related parameters==

{| border="2" cellspacing="0" cellpadding="2" 

!colspan="2" border="none" style="background:silver; color:black;" align="center"|Equipment 
|style="background:WhiteSmoke; color:black"|<b>XRD Powder</b>
|-
!style="background:silver; color:black;" align="center" width="60"|Purpose 
|style="background:LightGrey; color:black"| Crystal structure analysis
|style="background:WhiteSmoke; color:black"|
*Phase ID
*Crystal Size
*Crystallinity
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="6"|X-ray generator
|style="background:LightGrey; color:black"|
Maximum rated output
|style="background:WhiteSmoke; color:black"|
600 W
|-
|style="background:LightGrey; color:black"|
Rated tube voltage
|style="background:WhiteSmoke; color:black"|
40 kV
|-
|style="background:LightGrey; color:black"|
Rated tube current
|style="background:WhiteSmoke; color:black"|
15 mA
|-
|style="background:LightGrey; color:black"|
Type
|style="background:WhiteSmoke; color:black"|
Sealed tube
|-
|style="background:LightGrey; color:black"|
Target
|style="background:WhiteSmoke; color:black"|
Cu
|-
|style="background:LightGrey; color:black"|
Focus size
|style="background:WhiteSmoke; color:black"|
0.4 mm x 12 mm (Line)
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="4"|Goniometer
|style="background:LightGrey; color:black"|
Scanning mode
|style="background:WhiteSmoke; color:black"|
incident / receiver coupled
|-
|style="background:LightGrey; color:black"|
Goniomenter radius
|style="background:WhiteSmoke; color:black"|
145 mm
|-
|style="background:LightGrey; color:black"|
Minimum step size
|style="background:WhiteSmoke; color:black"|
0.001° (3.6")
|-
|style="background:LightGrey; color:black"|
Sample stage
|style="background:WhiteSmoke; color:black"|
Fixed with rotation
|-

!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics
|style="background:LightGrey; color:black"|Incident side
|style="background:WhiteSmoke; color:black"|
*0.04° soller slit
*Ni and Cu filter
*Divergence slits
*Beam mask
|-
|style="background:LightGrey; color:black"|Receiver side
|style="background:WhiteSmoke; color:black"|
*0.04° soller slit
*Ni filter
|-
!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates
|style="background:LightGrey; color:black"|Measurement temperature
|style="background:WhiteSmoke; color:black"|
May be heated in N<sub><sub>2</sub></sub> up to 500 °C
|-
|style="background:LightGrey; color:black"|Substrate size
|style="background:WhiteSmoke; color:black"|
Only for powders
|-
| style="background:LightGrey; color:black"|Allowed materials
|style="background:WhiteSmoke; color:black"|
All materials have to be approved
|- 
|}

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