Specific Process Knowledge/Thin film deposition/Deposition of Chromium/Thermal evaporation of Cr in Thermal evaporator: Difference between revisions

Revision as of 15:45, 29 May 2021 view source Eves (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 4,346 edits →X-ray reflectivity method ← Older edit		Revision as of 15:45, 29 May 2021 view source Eves (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 4,346 edits →X-ray photoelectron spectroscopy Newer edit →
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	===X-ray photoelectron spectroscopy===		===X-ray photoelectron spectroscopy===

	XPS profiles for Al films has been obtained using [[Specific_Process_Knowledge/Characterization/XPS/K-Alpha\|XPS K-Alpha equipment]].		XPS profiles for Cr films has been obtained using [[Specific_Process_Knowledge/Characterization/XPS/K-Alpha\|XPS K-Alpha equipment]].