Specific Process Knowledge/Thin film deposition/Deposition of Chromium/Thermal evaporation of Cr in Thermal evaporator: Difference between revisions

Revision as of 14:49, 29 May 2021 view source Eves (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 4,346 edits →X-ray photoelectron spectroscopy ← Older edit		Revision as of 14:52, 29 May 2021 view source Eves (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers 4,346 edits →SEM and AFM Newer edit →
Line 300:		Line 300:


	SEM and AFM measurements illustrate surface morphology and roughness.		[[Specific_Process_Knowledge/Characterization/SEM:_Scanning_Electron_Microscopy\|SEM]] and [[Specific_Process_Knowledge/Characterization/AFM:_Atomic_Force_Microscopy\|AFM]] measurements illustrate surface morphology and roughness.