Specific Process Knowledge/Thin film deposition/Deposition of Chromium/Thermal evaporation of Cr in Thermal evaporator: Difference between revisions
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[[image:eves_20210126_Cr_thermal_evaporator_09.png|center|300x300px|thumb|Figure 10. Thickness distribution across 6" wafer.]] | [[image:eves_20210126_Cr_thermal_evaporator_09.png|center|300x300px|thumb|Figure 10. Thickness distribution across 6" wafer. Measurement is performed using Dektak profilometer.]] | ||
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