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<i>This page is written by <b>Evgeniy Shkondin @DTU Nanolab</b> if nothing else is stated. <br>
<i>This page is written by <b>Evgeniy Shkondin @DTU Nanolab</b> if nothing else is stated. <br>
All images and photos on this page belonges to <b>DTU Nanolab</b> and <b>DTU Electro</b> (previous DTU Fotonik).<br>
All images and photos on this page belongs to <b>DTU Nanolab</b> and <b>DTU Electro</b> (previous DTU Fotonik).<br>
The fabrication and characterization described below were conducted in <b>2013-2016 by Evgeniy Shkondin, DTU Nanolab</b>.<br></i>
The fabrication and characterization described below were conducted in <b>2013-2016 by Evgeniy Shkondin, DTU Nanolab</b>.<br></i>


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|Spin-coating of CSAR resist to the thickness of 150 nm, followed by e-beam exposure.
|Spin-coating of CSAR resist to the thickness of 150 nm, followed by e-beam exposure.
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[[Specific_Process_Knowledge/Lithography/EBeamLithography/JEOL_JBX-9500FSZ|JEOL JBX-9500 Electron-beam]]  
[[Specific_Process_Knowledge/Lithography/EBeamLithography/JEOL_9500_User_Guide|JEOL JBX-9500 Electron-beam]]  
<br clear="all" />
<br clear="all" />
|[[image:Image2_ebeam_on_Si.jpg|250x350px|center]]
|[[image:Image2_ebeam_on_Si.jpg|250x350px|center]]