Specific Process Knowledge/Etch/ICP Metal Etcher/silicon/nano/Sinan331
Appearance
The Sinano3.31 recipe
| Recipe | Gas | BCl3 5 sccm, HBR 15 sccm |
|---|---|---|
| Pressure | 2 mTorr, Strike 3 secs @ 5 mTorr | |
| Power | 900 W CP, 75 W PP | |
| Temperature | 50 degs | |
| Hardware | 100 mm Spacers | |
| Time | 60, 120 and 180 secs | |
| Conditions | Run ID | 452, 453 and 454 |
| Conditioning | Sequence: Oxygen clean, MU tests, processes, no oxygen between runs | |
| Mask | 190 nm zep |
- The results of the Sinano3.31 recipe
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The 30 nm trenches etched 60 seconds
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The 60 nm trenches etched 60 seconds
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The 90 nm trenches etched 60 seconds
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The 120 nm trenches etched 60 seconds
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The 150 nm trenches etched 60 seconds
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The 30 nm trenches etched 120 seconds
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The 60 nm trenches etched 120 seconds
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The 90 nm trenches etched 120 seconds
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The 120 nm trenches etched 120 seconds
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The 150 nm trenches etched 120 seconds
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The 30 nm trenches etched 180 seconds
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The 60 nm trenches etched 180 seconds
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The 90 nm trenches etched 180 seconds
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The 120 nm trenches etched 180 seconds
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The 150 nm trenches etched 180 seconds
| Nominal trench line width | ' | ' | 30 | 60 | 90 | 120 | 150 | Average | Std. dev. |
| Etch rate | nm/min | 81 | 107 | 111 | 116 | 122 | 107 | 16 | |
| Sidewall angle | degs | 83 | 83 | 81 | 82 | 77 | 81 | 3 | |
| CD loss | nm/edge | -4 | -13 | -12 | -12 | -29 | -14 | 9 | |
| CD loss foot | nm/edge | 1 | 0 | 1 | -1 | -2 | 0 | 2 | |
| Bowing | 6 | 5 | 10 | 8 | 18 | 9 | 5 | ||
| Bottom curvature | -6 | -5 | -2 | -3 | 3 | -3 | 3 | ||
| Zep etch rate | nm/min | 81 | |||||||
| Nominal trench line width | ' | 30 | 60 | 90 | 120 | 150 | Average | Std. dev. |
| Etch rate | nm/min | 77 | 101 | 112 | 119 | 119 | 106 | 18 |
| Sidewall angle | degs | 85 | 84 | 84 | 82 | 82 | 83 | 1 |
| CD loss | nm/edge | -4 | -17 | -14 | -10 | -23 | -13 | 7 |
| CD loss foot | nm/edge | 2 | -4 | 0 | 2 | 4 | 1 | 3 |
| Bowing | 9 | 11 | 14 | 15 | 9 | 12 | 3 | |
| Bottom curvature | -28 | -4 | -2 | 2 | 3 | -6 | 13 | |
| Zep etch rate | nm/min | 56 | ||||||
| Nominal trench line width | ' | 30 | 60 | 90 | 150 | Average | Std. dev. |
| Etch rate | nm/min | 49 | 97 | 105 | 111 | 91 | 28 |
| Sidewall angle | degs | 76 | 83 | 82 | 80 | 80 | 3 |
| CD loss | nm/edge | 18 | 7 | 14 | 3 | 10 | 7 |
| CD loss foot | nm/edge | 23 | 20 | 28 | 30 | 25 | 5 |
| Bowing | -2 | 10 | -4 | -5 | 0 | 7 | |
| Bottom curvature | -28 | -9 | -2 | 1 | -9 | 13 | |
| Zep etch rate | nm/min | 53 | |||||