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- 18:49, 27 May 2025 Mmat talk contribs created page Specific Process Knowledge/Characterization/Dektak XTA (Created page with "==Dektak XTA stylus profiler== The Dektak XTA stylus profiler from Brüker is used for profiling surfaces of samples with structures in the micro- and nanometer range. The size of the structures that can be measured is limited by the tip dimensions. A profile measurement can be done across a specific structure by using a high magnification camera to locate the structure. It is also possible to program the stylus to measure in several positions, defined with respect to...")