Specific Process Knowledge/Characterization/Four-Point Probe
Four-Point Probe
The four-Point Probe is used to make I/V measurement for resistance and resistivity measurement. But can also be used to find thickness of thin layers or test if is a N- or P-type wafer.
The four pins are pushed on the surface and a measurement is performed. It works only for 4" wafers because a special holder is need.
The user manual,technical information and contact information can be found in LabManager: