Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/Etch slow
Etch slow
This process development is going on to find an etch recipe that is so gentle that the resist masking material can be removed with acetone + ultrasound within hopefully 10min. This is important when a metal is to be etched as this cannot withstand plasma ashing (to remove reist mask) after the etch.
Parameter | Si etch first try |
---|---|
Neutalizer current [mA] | 450 |
RF Power [W] | 1200 |
Beam current [mA] | 400 |
Beam voltage [V] | 400 |
Beam accelerator voltage | 400 |
Ar flow to neutralizer [sccm] | 6.0 |
Ar flow to beam [sccm] | 6.0 |
Rotation speed [rpm] | 20 |
Stage angle [degrees] | 10 |
Platen temp. [dg. Celcius] | 15 |
He cooling pressure [mTorr] | 37.5 |
Results | vvv |
etch time [min] | 40 |
Etch rate in Si [nm/min] | 19.7 |
Total time in Acetone + ultrasound [min] | 17 |
Was the resist completely removed after acetone + ultrasound? | no |