Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)/Quartz etch using AOE
Nanoetch in quartz 65mmx65mmx6.25mm substrates
by bge@danchip
Some priliminary results
The tests were done on 2" quartz wafers with a thickness of 1mm. These were placed on a 65mmx65mmx6,25mm quartz plate with a 2" groove. This 65mmx65mmx6,25mm plate was placed on a 4" Si wafer with a 65mmx65mm groove. the masking material was Cr sputter deposited in Wordentec and and patterned with ZEP520A resist by e-beam and ICP metal Cr etch.
Recipe used STS65x65:
Parameter | Crom mask |
---|---|
Coil Power [W] | 1200 |
Platen Power [W] | 500 |
Platen temperature [oC] | 50 |
CF flow [sccm] | 43 |
CF flow [sccm] | 20 |
O flow [sccm] | 10 |
Pressure [mTorr] | 8 |
Parameter | Results |
---|---|
Etch rate | ~300nm/min |
Etch profile | 86-87 degrees |
ARDE | There does not seem to be a significant aspect ratio dependency in the etch rate up to aspect ratio 1:2 ~ 1:3 |
Mask selectivity | 20nm Cr is enough to etch 200nm in the quartz |
Images | . |