Specific Process Knowledge/Etch/AOE (Advanced Oxide Etch)/Silicon Nitride Etch using AOE
Parameter | SiN_etch |
---|---|
Coil Power [W] | 700 |
Platen Power [W] | 100 |
Platen temperature [oC] | 0 |
CFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _4} FFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _8} flow [sccm] | 5 |
He flow [sccm] | 174 |
HFailed to parse (SVG (MathML can be enabled via browser plugin): Invalid response ("Math extension cannot connect to Restbase.") from server "https://wikimedia.org/api/rest_v1/":): {\displaystyle _2} flow [sccm] | 4 |
Pressure [mTorr] | 4 |
Typical results | Resist mask |
---|---|
Silicon nitride (LPCVD) etch rate | ~60 nm/min |
Selectivity to photo resist [:1] | ? |
Etch rate in Si | ? |
Etch rate in SiO2 | ? |
Profile [o] | not tested |
Images | . |
Comments | . |