Specific Process Knowledge/Etch/Wet Silicon Oxide Etch (BHF)/BHF etch rates
Etch rate in | BHF | 5% HF | 30% HF | 40% HF | BHF with wetting agent | ||||||
---|---|---|---|---|---|---|---|---|---|---|---|
Wet Thermal Oxide [nm/min] | 78.191 | 24.891 | 282.851 | 79 | Pyrex [nm/min] | 35 | 3000 | ||||
TEOS [nm/min] | 265 | 153 | |||||||||
PECVD1 (Standard) Oxide [nm/min] | 147 | 87 | |||||||||
PECVD3 (LFSiO) Oxide [nm/min] | 2253 | ||||||||||
Silicon Rich Nitride [nm/min] | 0.331 | 0.601 | 2.61 | ||||||||
Stochiometric Nitride Si3N4 [nm/min] | 0.752 |
1The measured etch rates have been made and donated by Eric Jensen and Rolf Møller-Nielsen from DTU-Nanotech, October 2013.
2The measured etch rates have been made and donated by Morten Bo Mikkelsen from DTU-Nanotech, March 2013.
3The measured etch rate has been made and donated by Trine Holm Christensen from DTU-Space, January 2015.