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Specific Process Knowledge/Characterization
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From LabAdviser
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Specific Process Knowledge
Revision as of 13:03, 20 September 2007 by
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Choose topic
Surface imaging
Topographic measurement
Stress measurement
Filmthickness measurement
Element analysis
Measurement of optical constants
Hydrophobicity measurement
Resistivity measurement
Choose equipment
SEM: Scanning Electron Microscopy
AFM: Atomic Force Microscopy
Profiler
Optical microscope
Optical characterization
SIMS: Secondary Ion Mass Spectrometry
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