Specific Process Knowledge/Thin film deposition/Deposition of Titanium Oxide/IBSD of TiO2
Feedback to this page: click here
Acceptance test for TiO2 deposition:
. | Acceptance Criteria |
Acceptance Results recipe 1 |
Acceptance Results recipe 2 | Acceptance Results recipe 2 |
---|---|---|---|---|
Substrate information |
|
|
|
|
Material to be deposited |
The purpose of the TiO2 is to be part of a mirror: <br\> 5 quarterwavelength pairs of <br\> SiO2 <br\> TiO2 <br\> Extra quarterwavelength layer of <br\> TiO2 <br\> 5 quarterwavelength pairs of <br\> SiO2 <br\> TiO2 <br\> Design wavelength (for refractive indices and layer thicknesses):1300nm <br\> The acceptance criteria is set up for the single SiO2 and TiO2 layers. <br\> Five runs in a row for each material. |
|
|
TiO2 |
Deposition thickness |
|
|
|
|
Deposition rate |
|
One stdev - wafer to wafer |
Only done once |
|
Thickness uniformity |
|
|
|
|
Reproducibility |
|
|
|
|
Stress |
|
|
|
|
Refractive index | . |
|
|
|
Recipe 1 | Recipe 2 | |
---|---|---|
Platen angle | 50 degrees | 30 degrees |
Platen rotation speed | 20rpm | 20rpm |
Ar(N) flow | 4 sccm | 4 sccm |
Ar(dep. source) flow | 9 sccm | 9 sccm |
O2(dep. source) flow | 2 sccm | 2 sccm |
O2(etch source) flow | 8 sccm | 8 sccm |
I(N) | 459mA | 450mA |
Power | 875W | 875W |
I(B) | 390mA | 390mA |
V(B) | 1300V | 1300V |
Vacc(B) | 400V | 400V |
Deposition time | 52min | 40min |
Repetitions of the acceptance test
Made on 100mm wafers.
Test1-3 were done without a bakeout. 1 Hour after a user had run several hours of runs with the same recipe.
Test4-6 were done after a bakeout. Several hours after the system had been used and with out heat-up recipe and conditioning run.
Test7-13 were done after a change to deposition mode (the chamber has been open), a bakeout for 8 hours, a heat-up of the deposition source and then the 7 wafers in a row.The run to run reproduciblity improves after the two first wafers. This is consistent with the advise from Oxford Plasma Systems to run a 40min conditioning run before your real wafers (or wafer with multiple layers).
Acceptance recipe TiO2 2 | Deposition thickness (0,0) | Deposition thickness average | Deposition time | Deposition rate (0,0) | Refrative index@632.8nm |
2014-06-16 test1 | 60.7 nm | 58.4 nm | 20min | 3.04nm/min | 2.42679 |
2014-06-16 test2 | 59.4 nm | 59.6 nm | 20min | 2.97nm/min | 2.42651 |
2014-06-16 test3 | 59.3 nm | 59.2 nm | 20min | 2.97nm/min | 2.4249 |
2014-06-19 test4 | 60.62/60.51 | 59.49/59.38 | 20min | 2.97nm/min | 2.42776/2.43090 |
2014-06-19 test5 | 59.92/59.84 | 59.80/59.73 | 20min | 2.99nm/min | 2.42776/2.42983 |
2014-06-19 test6 | 60.31 | 59.53 | 20min | 2.98nm/min | 2.42776 |
Acceptance recipe TiO2 2 | Deposition thickness min (edge) | Deposition thickness max (center) | Deposition time | Deposition rate (0,0) |
2014-07-22 test7 | 56.6 nm | 57.6 nm | 20min | 2.88nm/min |
2014-07-22 test8 | 55.4 nm | 56.4 nm | 20min | 2.82nm/min |
2014-07-22 test9 | 53.5 nm | 55.6 nm | 20min | 2.78nm/min |
2014-07-22 test10 | 54.3 nm | 55.4 nm | 20min | 2.77nm/min |
2014-07-22 test11 | 54.1 nm | 55.2 nm | 20min | 2.76nm/min |
2014-07-22 test12 | 54.0 nm | 55.2 nm | 20min | 2.76nm/min |
2014-07-22 test13 | 53.8 nm | 54.9 nm | 20min | 2.75nm/min |
Other results
Roughness of the surface
Measured with the Optical profiler - PSI mode (on one sample from the acceptace test): Sa= ~1nm
How to pattern TiO2
TiO2 can be difficult to pattern since TiO2 is a very hand material that is also difficult to etch wet. Hot sulfuric acid can remove it (not allowed at Danchip without special permission). HF will etch it at a very low etch rate. It can be sputtered by IBE but also at a very low etch rate and there is no masking material with a resonable selectivity to TiO2. If you want to pattern a TiO2 that you deposite in the IBSD Ionfab then we advice you to do it with a lift-off process. Make your resist pattern, deposite TiO2 on top and do the lift-off in an apropriate solvent depending on the resist chosen.