Specific Process Knowledge/Thin film deposition/Deposition of Tungsten
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This page is written by DTU Nanolab staff
Tungsten deposition
Tungsten (W) can be deposited by e-beam evaporation and sputtering. However, in case of evaporation the process generates a lot of heat, so it is not easy to deposit films much thicker than 50-60 nm. Sputtering can be used without any particular issues. In the chart below you can compare the deposition equipment.
Evaporation of W
Sputtering of W
- Sputtering of Tungsten in the Sputter Coater 3
- DC Sputtering of Tungsten in the Sputter-System (Lesker)
- DC Sputtering of Tungsten in the Sputter-system Metal-Nitride (PC3)
- HiPIMS Sputtering of Tungsten in the Sputter-system Metal-Nitride (PC3)
| E-beam evaporation (Temescal) | Sputter-system (Lesker) | Sputter deposition ((Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) ) | Sputter coater (Sputter coater 03) | |
|---|---|---|---|---|
| General description | E-beam evaporation of W | DC Sputtering of W | DC and HiPIMS Sputtering of W | DC Sputtering of W |
| Pre-clean | Ar ion beam | None | RF bias on a substrate | None |
| Layer thickness | 10Å to 20nm* | 10Å to 600nm | 10Å to 600nm | 10Å to 250nm |
| Deposition rate | 0.5 Å/s to 1 Å/s | about 1 Å/s | about 1 Å/s | configuration dependent |
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| Comments | Substrate gets hot during deposition
(for a 60 nm film it rose above 123 C) Wait for low base pressure before start (3-5 10-7 Torr) |
Deposition rate is 0.107 nm/s for 150W and 3mTorr (Src3, DC) | Deposition rate is 0.124 nm/s for 140W and 3mTorr (PC3, Src3 DC),
(0.04 nm/s using HiPIMS - PC3, Src3) |
Note! Bad uniformity.
Deposition rate is 0.03 nm/s using big glass chamber. Deposition rate is 0.2-0.9 nm/s (current dependent) using small glass chamber. |
* For thicknesses above 20 nm talk to staff (write to thinfilm@nanolab.dtu.dk), as the heat and subsequent pressure rise means the deposition needs to be carried out in steps.